公开(公告)号：US11145385B2

公开(公告)日：2021-10-12

申请号：US16646353

申请日：2018-10-31

申请人： AMLOGIC (SHANGHAI) CO., LTD.

发明人： Yuegui He

IPC分类号： G11C29/00 ,  G11C29/56 ,  G11C29/38

摘要： The present invention relates to the technical field of integrated chips, and more particularly, to a system-level test method for a flash memory. The method comprises: step S1, providing a test flag file, and storing a test number parameter in the test flag file; step S2, determining whether a value of the test number parameter reaches a pre-set value; if not, turning to step S3; if yes, ending and counting a verification result; step S3, performing one partition mirror data check on all partitions of the flash memory, and performing one file data check on a current system file of the flash memory; and step S4, restarting a test device, subtracting one from the value of the test number parameter, and returning to step S2.