公开(公告)号：US09939476B2

公开(公告)日：2018-04-10

申请号：US14866036

申请日：2015-09-25

Applicant: ANALOG DEVICES GLOBAL

Inventor： Christian Steffen Birk ,  John A. Cleary ,  David Sayago Montilla ,  Elizabeth A. Lillis ,  Padraig O'Connor ,  Eoin E. English ,  Patrick Pratt ,  Kathleen Embrechts ,  Wim Rens ,  Jan Crols

IPC: G01R27/26 ,  B81C99/00

CPC classification number: G01R27/2605 ,  B81B2201/0235 ,  B81C99/003

Abstract: Embodiments of the present invention may provide a method of measuring an unknown capacitance of a device. The method may comprise the steps of driving a test signal to a circuit system that includes a current divider formed by the device with unknown capacitance and a reference capacitor; mirroring a current developed in the reference capacitor to a second circuit system that includes a measurement impedance; measuring a voltage within the second circuit system; and deriving a capacitance of the unknown capacitance based on the measured voltage with reference to a capacitance of the reference capacitor and the measurement impedance.

公开(公告)号：US20170089966A1

公开(公告)日：2017-03-30

申请号：US14866036

申请日：2015-09-25

Applicant: ANALOG DEVICES GLOBAL

Inventor： Christian Steffen Birk ,  John A. Cleary ,  David Sayago Montilla ,  Elizabeth A. Lillis ,  Padraig O'Connor ,  Eoin E. English ,  Patrick Pratt ,  Kathleen Embrechts ,  Wim Rens ,  Jan Crols

IPC: G01R27/26

CPC classification number: G01R27/2605 ,  B81B2201/0235 ,  B81C99/003

Abstract: Embodiments of the present invention may provide a method of measuring an unknown capacitance of a device. The method may comprise the steps of driving a test signal to a circuit system that includes a current divider formed by the device with unknown capacitance and a reference capacitor; mirroring a current developed in the reference capacitor to a second circuit system that includes a measurement impedance; measuring a voltage within the second circuit system; and deriving a capacitance of the unknown capacitance based on the measured voltage with reference to a capacitance of the reference capacitor and the measurement impedance.