公开(公告)号：US20240264262A1

公开(公告)日：2024-08-08

申请号：US18421000

申请日：2024-01-24

Applicant: ANRITSU CORPORATION

Inventor： Takashi IWASE ,  Yuki KONDO ,  Chunqing LIANG

IPC: G01S5/02 ,  G01R35/00

CPC classification number: G01S5/021 ,  G01R35/005

Abstract: To provide a measurement apparatus capable of simplifying a test configuration and reducing cost. A measurement apparatus includes a measurement unit 2 that measures an RF signal received from a DUT 20, a signal generation unit 3 that generates and transmits a test RF signal to be transmitted to the DUT 20, and a 1-PPS signal generation unit 4 that generates a 1-PPS signal for synchronization of transmission/reception timing between the measurement unit 2, the signal generation unit 3, and the DUT 20, and outputs the generated 1-PPS signal to each of the measurement unit 2, the signal generation unit 3, and the DUT 20.