Abstract:
To provide a measurement apparatus capable of simplifying a test configuration and reducing cost. A measurement apparatus includes a measurement unit 2 that measures an RF signal received from a DUT 20, a signal generation unit 3 that generates and transmits a test RF signal to be transmitted to the DUT 20, and a 1-PPS signal generation unit 4 that generates a 1-PPS signal for synchronization of transmission/reception timing between the measurement unit 2, the signal generation unit 3, and the DUT 20, and outputs the generated 1-PPS signal to each of the measurement unit 2, the signal generation unit 3, and the DUT 20.
Abstract:
The signal analysis device includes a synchronization data generation unit 19a that outputs an A/D-converted correction signal as first synchronization data which is associated with time based on the timing of a trigger signal input from the outside, a synchronization correction value calculation unit 19c that calculates, as a first synchronization correction value, an amplitude ratio, a phase difference, and a time difference between the first synchronization data and second synchronization data input from the outside on the basis of the first synchronization data and the second synchronization data, and a correction unit 19d that corrects the amplitude, phase, and timing of the RF signal output from the object to be measured, on the basis of the first synchronization correction value or a second synchronization correction value input from the outside.