Broadband Controllable Optical Phase Shifters

    公开(公告)号:US20240061280A1

    公开(公告)日:2024-02-22

    申请号:US18229872

    申请日:2023-08-03

    Applicant: Apple Inc.

    CPC classification number: G02F1/0134 G02F2201/063 G02F2203/05

    Abstract: Various embodiments disclosed herein describe optomechanical phase shifters. The optomechanical phase shifters may be configured with an asymmetry that improves the performance of the OM phase shifter as a function of wavelength. In some instances, the optomechanical phase shifter includes a section of a waveguide having an asymmetric cross-sectional shape. In other instances an optomechanical phase shifter is incorporated into a controllable optical switch, such that OM phase shifters may be actuated to selectively route light to different outputs of the controllable optical switch.

    Optical Splitters with Reflective Surfaces
    2.
    发明公开

    公开(公告)号:US20240103224A1

    公开(公告)日:2024-03-28

    申请号:US18230475

    申请日:2023-08-04

    Applicant: Apple Inc.

    CPC classification number: G02B6/2817

    Abstract: Configurations for an optical splitter that includes a continuous curved reflector and methods thereof are disclosed. The optical splitter includes an input waveguide, one or more continuous curved reflector, and multiple output waveguides. The one or more continuous curved reflector may direct light toward the output waveguides. The optical splitter may include a single continuous curved reflector, or may include multiple continuous curved reflectors. In other instances, an optical splitter may include a lensed reflector that includes a plurality of continuous curved segments.

    Photonic Passive Delay Lines with Reduced Parasitic Losses

    公开(公告)号:US20240094468A1

    公开(公告)日:2024-03-21

    申请号:US18234562

    申请日:2023-08-16

    Applicant: Apple Inc.

    CPC classification number: G02B6/125

    Abstract: Various embodiments disclosed herein describe photonic passive delay lines that have a waveguide wound into a plurality of straight segments and bends. The photonic passive delay lines are configured to reduce losses from parasitic modes of light generated at the bends. Embodiments of the photonic passive delay lines vary the dimensions of the straight segments to provide different amounts of dephasing between a mode of input light received by the photonic passive delay line and one or more parasitic modes.

    Despeckling in optical measurement systems

    公开(公告)号:US12111207B2

    公开(公告)日:2024-10-08

    申请号:US18234794

    申请日:2023-08-16

    Applicant: Apple Inc.

    CPC classification number: G01J1/44

    Abstract: Embodiments are directed to optical measurement systems that utilize multiple emitters to emit light during a measurement, as well as methods of performing measurements using these optical measurement systems. The optical measurement systems may include a light generation assembly that is configured to generate light via a light source unit, and a photonic integrated circuit that includes a launch group having a plurality of emitters. Each of these emitters is optically coupled to the light generation assembly to receive light generated from the light generation assembly, and may emit this light from a surface of the photonic integrated circuit. The optical measurement system may perform a measurement in which the light generation assembly generates light and each of the plurality of emitters simultaneously emit light received from the light generation assembly.

    Despeckling in Optical Measurement Systems
    9.
    发明公开

    公开(公告)号:US20240102856A1

    公开(公告)日:2024-03-28

    申请号:US18234794

    申请日:2023-08-16

    Applicant: Apple Inc.

    CPC classification number: G01J1/44 G02B6/43 G01J2001/444

    Abstract: Embodiments are directed to optical measurement systems that utilize multiple emitters to emit light during a measurement, as well as methods of performing measurements using these optical measurement systems. The optical measurement systems may include a light generation assembly that is configured to generate light via a light source unit, and a photonic integrated circuit that includes a launch group having a plurality of emitters. Each of these emitters is optically coupled to the light generation assembly to receive light generated from the light generation assembly, and may emit this light from a surface of the photonic integrated circuit. The optical measurement system may perform a measurement in which the light generation assembly generates light and each of the plurality of emitters simultaneously emit light received from the light generation assembly.

    Optical Measurement System with Multiple Launch Sites

    公开(公告)号:US20230324286A1

    公开(公告)日:2023-10-12

    申请号:US18121427

    申请日:2023-03-14

    Applicant: Apple Inc.

    CPC classification number: G01N21/31

    Abstract: Various embodiments disclosed herein describe optical measurement systems for characterizing a sample. The optical measurement systems may selectively emit light from different numbers of launch groups, and may include a multi-stage optical switch network that may be controlled to route light to a desired number of launch groups. The optical measurement systems may further measure light using a corresponding number of detector groups. The optical measurement systems may perform measurements using a plurality of different wavelengths, where different groups of these wavelengths may be measured using different numbers of launch groups (as well as corresponding detector groups).

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