公开(公告)号：US20240405135A1

公开(公告)日：2024-12-05

申请号：US18388449

申请日：2023-11-09

Applicant: Apple Inc.

Inventor： Matthew T. Morea ,  Daniel Mahgerefteh ,  Dylan N. Rees ,  Mark A. Arbore ,  Romain F. Chevallier

IPC: H01L31/0232 ,  G01J1/02 ,  H01L31/0304 ,  H01L31/0392

Abstract: An electromagnetic radiation detectors includes anti-reflective epitaxial structures incorporated into an epitaxial stack of the electromagnetic radiation detector. An anti-reflective structures as described herein are grown between (and thereby connect) two lattice-matched epitaxial layers that have different refractive indices. The anti-reflective structure reduces Fresnel reflections that would otherwise occur if the two epitaxial layers were directly connected.