公开(公告)号：US20190137337A1

公开(公告)日：2019-05-09

申请号：US16095323

申请日：2017-04-13

Applicant: Apple Inc.

Inventor： Trent D. RIDDER ,  Mark Alan ARBORE ,  Gary SHAMBAT ,  Robert CHEN ,  David I. SIMON ,  Miikka M. KANGAS

IPC: G01J3/427 ,  G01J3/28 ,  G01J3/10 ,  G01N21/35

Abstract: Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.

公开(公告)号：US20180231457A1

公开(公告)日：2018-08-16

申请号：US15751454

申请日：2016-08-29

Applicant: APPLE INC.

Inventor： Robert CHEN ,  Trent D. RIDDER ,  Miikka M. KANGAS ,  David I. SIMON ,  Matthew A. TERREL

IPC: G01N21/27 ,  G01N21/31

CPC classification number: G01N21/274 ,  G01N21/31 ,  G01N2201/124 ,  G01N2201/12723 ,  G01N2201/12776

Abstract: Methods and systems for measurement time distribution for referencing schemes are disclosed. The disclosed methods and systems can be capable of dynamically changing the measurement time distribution based on the sample signal, reference signal, noise levels, and SNR. The methods and systems can be configured with a plurality of measurement states, including a sample measurement state, reference measurement state, and dark measurement state. In some examples, the measurement time distribution scheme can be based on the operating wavelength, the measurement location at the sampling interface, and/or targeted SNR. Examples of the disclosure further include systems and methods for measuring the different measurement states concurrently. Moreover, the systems and methods can include a high-frequency detector to eliminate or reduce decorrelated noise fluctuations that can lower the SNR.