公开(公告)号：US09568511B2

公开(公告)日：2017-02-14

申请号：US14208408

申请日：2014-03-13

Applicant: APPLIED MICRO CIRCUITS CORPORATION

Inventor： Luca Ravezzi ,  Qawi Harvard ,  Hamid Partovi

IPC: G01R19/165 ,  G01R19/00 ,  G06F1/26

CPC classification number: G01R19/16552 ,  G01R19/0007 ,  G06F1/26 ,  G06F1/305

Abstract: Various aspects provide a high frequency voltage supply monitor capable of monitoring high frequency variations of the voltage supply inside a microelectronic circuit substantially in real time. The voltage supply monitor can comprise a differential amplifier circuit having a substantially constant gain over a wide bandwidth, allowing the supply voltage variations to be amplified according to a known gain under a wide range of conditions. The amplified signal can then be sent to an output port for monitoring and measurement by an external display device.

Abstract translation: 各种方面提供了一种能够基本上实时地监测微电子电路内的电压供应的高频变化的高频电压监视器。 电压监视器可以包括在宽带宽上具有基本上恒定的增益的差分放大器电路，从而允许根据在宽范围条件下的已知增益放大电源电压变化。 放大的信号然后可以被发送到输出端口，用于由外部显示装置进行监视和测量。

公开(公告)号：US20150323569A1

公开(公告)日：2015-11-12

申请号：US14208408

申请日：2014-03-13

Applicant: APPLIED MICRO CIRCUITS CORPORATION

Inventor： Luca Ravezzi ,  Qawi Harvard ,  Hamid Partovi

IPC: G01R19/00

CPC classification number: G01R19/16552 ,  G01R19/0007 ,  G06F1/26 ,  G06F1/305

Abstract: Various aspects provide a high frequency voltage supply monitor capable of monitoring high frequency variations of the voltage supply inside a microelectronic circuit substantially in real time. The voltage supply monitor can comprise a differential amplifier circuit having a substantially constant gain over a wide bandwidth, allowing the supply voltage variations to be amplified according to a known gain under a wide range of conditions. The amplified signal can then be sent to an output port for monitoring and measurement by an external display device.

Abstract translation: 各种方面提供了一种能够基本上实时地监测微电子电路内的电压供应的高频变化的高频电压监视器。 电压监视器可以包括在宽带宽上具有基本上恒定的增益的差分放大器电路，从而允许根据在宽范围条件下的已知增益放大电源电压变化。 放大的信号然后可以被发送到输出端口，用于由外部显示装置进行监视和测量。