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公开(公告)号:US20140087076A1
公开(公告)日:2014-03-27
申请号:US13950049
申请日:2013-07-24
Applicant: ASM International N.V.
Inventor: Suvi P. Haukka , Marko J. Tuominen , Antti Rahtu
CPC classification number: C23C16/08 , C23C16/0218 , C23C16/18 , C23C16/45525 , H01L21/28562
Abstract: The invention relates generally to processes for enhancing the deposition of noble metal thin films on a substrate by atomic layer deposition. Treatment with gaseous halides or metalorganic compounds reduces the incubation time for deposition of noble metals on particular surfaces. The methods may be utilized to facilitate selective deposition. For example, selective deposition of noble metals on high-k materials relative to insulators can be enhanced by pretreatment with halide reactants. In addition, halide treatment can be used to avoid deposition on the quartz walls of the reaction chamber.
Abstract translation: 本发明一般涉及通过原子层沉积来增强在衬底上沉积贵金属薄膜的方法。 使用气态卤化物或金属有机化合物进行处理减少了在特定表面上沉积贵金属的孵育时间。 该方法可用于促进选择性沉积。 例如,可以通过用卤化物反应物预处理来提高贵金属在高k材料上相对于绝缘体的选择性沉积。 此外,可以使用卤化物处理以避免沉积在反应室的石英壁上。
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公开(公告)号:US09587307B2
公开(公告)日:2017-03-07
申请号:US13950049
申请日:2013-07-24
Applicant: ASM International N.V.
Inventor: Suvi P. Haukka , Marko J. Tuominen , Antti Rahtu
IPC: C23C16/08 , C23C16/02 , C23C16/18 , C23C16/455 , H01L21/285
CPC classification number: C23C16/08 , C23C16/0218 , C23C16/18 , C23C16/45525 , H01L21/28562
Abstract: The invention relates generally to processes for enhancing the deposition of noble metal thin films on a substrate by atomic layer deposition. Treatment with gaseous halides or metalorganic compounds reduces the incubation time for deposition of noble metals on particular surfaces. The methods may be utilized to facilitate selective deposition. For example, selective deposition of noble metals on high-k materials relative to insulators can be enhanced by pretreatment with halide reactants. In addition, halide treatment can be used to avoid deposition on the quartz walls of the reaction chamber.
Abstract translation: 本发明一般涉及通过原子层沉积来增强在衬底上沉积贵金属薄膜的方法。 使用气态卤化物或金属有机化合物进行处理减少了在特定表面上沉积贵金属的孵育时间。 该方法可用于促进选择性沉积。 例如,可以通过用卤化物反应物预处理来提高贵金属在高k材料上相对于绝缘体的选择性沉积。 此外,可以使用卤化物处理以避免沉积在反应室的石英壁上。
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