公开(公告)号：US11942302B2

公开(公告)日：2024-03-26

申请号：US17361119

申请日：2019-12-17

申请人： ASML Netherlands B.V.

发明人： Arno Jan Bleeker ,  Pieter Willem Herman De Jager ,  Maikel Robert Goosen ,  Erwin Paul Smakman ,  Albertus Victor Gerardus Mangnus ,  Yan Ren ,  Adam Lassise

IPC分类号： H01J37/09 ,  H01J37/147 ,  H01J37/244 ,  H01J37/26 ,  H01J37/28

CPC分类号： H01J37/1474 ,  H01J37/244 ,  H01J37/265 ,  H01J37/28 ,  H01J2237/24475 ,  H01J2237/2448 ,  H01J2237/2817

摘要： Apparatuses and methods for charged-particle detection may include a deflector system configured to direct charged-particle pulses, a detector having a detection element configured to detect the charged-particle pulses, and a controller having a circuitry configured to control the deflector system to direct a first and second charged-particle pulses to the detection element; obtain first and second timestamps associated with when the first charged-particle pulse is directed by the deflector system and detected by the detection element, respectively, and third and fourth timestamps associated with when the second charged-particle pulse is directed by the deflector system and detected by the detection element, respectively; and identify a first and second exiting beams based on the first and second timestamps, and the third and fourth timestamps, respectively.