Hybrid Analysis of Emerging Trends for Process Control
    2.
    发明申请
    Hybrid Analysis of Emerging Trends for Process Control 审中-公开
    过程控制新兴趋势的混合分析

    公开(公告)号:US20130041709A1

    公开(公告)日:2013-02-14

    申请号:US13207422

    申请日:2011-08-11

    IPC分类号: G06Q10/00

    CPC分类号: G06Q10/0639 G05B23/0262

    摘要: An asymmetric approach is used for evaluating process control data, whereby one approach is used for determining entry into the emerging life cycle phase (i.e., presence of a new defect) and a different approach is used for detecting entry into the other life cycle phases such as cresting and recovering. An evidence curve is created from observed instance data for a particular defect, and the slope of this evidence curve is analyzed programmatically by applying one or more tests, in combination with sequential time-reversed estimation, to determine return-to-normal conditions with a desired level of confidence.

    摘要翻译: 使用非对称方法来评估过程控制数据,由此使用一种方法来确定进入新兴生命周期阶段(即,存在新缺陷),并且使用不同的方法来检测进入其他生命周期阶段,例如 作为顶峰和恢复。 从针对特定缺陷的观察到的实例数据创建证据曲线,并且通过应用一个或多个测试结合顺序时间反转估计来以编程方式分析该证据曲线的斜率,以确定具有 期望的信心水平。

    Advanced Statistical Detection of Emerging Trends
    3.
    发明申请
    Advanced Statistical Detection of Emerging Trends 审中-公开
    新兴趋势的高级统计检测

    公开(公告)号:US20130041625A1

    公开(公告)日:2013-02-14

    申请号:US13207425

    申请日:2011-08-11

    IPC分类号: G06F19/00

    摘要: Advanced statistical detection of emerging trends in a process is disclosed, based on a Repeated Weighted Geometric Cumulative Sum analysis, which may be combined with time window-based estimation of proportions and related thresholds. Threshold derivation and significance computation is based on parallel simulation runs with power-exponential tail approximations. A battery of tests using the statistical theory of sequential analysis and change-point theory in combination with targets is used to evaluate non-conforming conditions in a process. Trends in fall-out rates are detected based on non-time-to-failure data that corresponds to counts of failures in consecutive time periods, with possibility of delayed input.

    摘要翻译: 基于重复加权几何累积和分析,公开了对进程中新兴趋势的高级统计检测,其可以与基于时间窗口的比例估计和相关阈值相结合。 阈值推导和显着性计算基于具有幂指数尾部近似的并行仿真运行。 使用序列分析和变化理论的统计理论与目标结合的一组测试用于评估过程中的不符合条件。 基于与连续时间段内的故障计数相对应的非时间到故障数据检测掉落速率的趋势,具有延迟输入的可能性。

    TREND-BASED TARGET SETTING FOR PROCESS CONTROL
    6.
    发明申请
    TREND-BASED TARGET SETTING FOR PROCESS CONTROL 审中-公开
    基于趋势的过程控制目标设置

    公开(公告)号:US20130030863A1

    公开(公告)日:2013-01-31

    申请号:US13409920

    申请日:2012-03-01

    IPC分类号: G06Q30/02

    CPC分类号: G05B19/042 Y02P90/265

    摘要: Determining a suitable target for an entity (such as a product) in a process control environment, based on observed process control data. A preferred embodiment organizes data in a hierarchical structure designed for automating the target-setting process; derives target “yardsticks” for various components based on this data structure; employs techniques to estimate proportions using sample-size-based trimming in conjunction with bias-correction techniques (where appropriate); and derives targets based on combining yardsticks and confidence regions for parameters that characterize component quality

    摘要翻译: 基于观察到的过程控制数据,确定过程控制环境中的实体(例如产品)的合适目标。 优选实施例以设计用于使目标设定过程自动化的分级结构来组织数据; 基于该数据结构,为各种组件导出目标标尺; 采用技术来估计比例,使用基于样本量的修剪结合偏差校正技术(如适用); 并根据组合质量和特征区域的参数来确定目标

    DISTRIBUTION NETWORK MAINTENANCE PLANNING
    7.
    发明申请
    DISTRIBUTION NETWORK MAINTENANCE PLANNING 有权
    分销网络维护计划

    公开(公告)号:US20130041705A1

    公开(公告)日:2013-02-14

    申请号:US13205190

    申请日:2011-08-08

    IPC分类号: G06Q10/00

    CPC分类号: G06Q10/10 G06Q10/06

    摘要: A system, method and computer program product for maintaining an infrastructure of components. The system receives structured data, unstructured data, and infrastructure data from a database. The system runs at least one statistical and optimization modeler with one or more of: the received structured data, the received unstructured data and the received infrastructure data, in order to calculate a health index of at least one component of the infrastructure. The health index represents a health attribute of the at least one component. The system establishes at least one maintenance plan of the infrastructure, based on the calculated health index. Each established maintenance plan is associated with at least one health index. The system compares health indices of the at least one established maintenance plan. The system selects a plan, among the at least one established maintenance plan, whose health index is a maximum among the compared health indices.

    摘要翻译: 一种用于维护组件基础设施的系统,方法和计算机程序产品。 系统从数据库接收结构化数据,非结构化数据和基础架构数据。 该系统运行至少一个统计和优化建模器,具有以下一个或多个:接收的结构化数据,接收的非结构化数据和接收的基础设施数据,以便计算基础设施的至少一个组件的健康指数。 健康指数表示至少一个组件的健康属性。 系统根据计算出的健康指数建立基础设施的至少一个维护计划。 每个既定的维护计划与至少一个健康指数相关联。 该系统比较至少一个已建立的维护计划的健康指数。 所述系统在所述至少一个已建立的维护计划中选择其健康指数在所述健康指数中的最大值的计划。

    Design Structure and System for Identification of Defects on Circuits or Other Arrayed Products
    9.
    发明申请
    Design Structure and System for Identification of Defects on Circuits or Other Arrayed Products 审中-公开
    用于识别电路或其他阵列产品缺陷的设计结构和系统

    公开(公告)号:US20080148201A1

    公开(公告)日:2008-06-19

    申请号:US11969294

    申请日:2008-01-04

    IPC分类号: G06F17/50

    CPC分类号: H01L22/20

    摘要: A system and method is disclosed for assessing a probability of failure of operation of a semiconductor wafer. The method includes inputting risk factor data into a memory and inputting a plurality of wafers into a semiconductor fabrication manufacturing process. A subset of wafers is selected to obtain a sample population and at least one region of each wafer of the sample population is inspected. Circuit design data associated with each wafer of the sample population is obtained and one or more defects that present an increased risk to the operation of a particular wafer are identified. The identification is a function of the risk factor data, the inspecting step and the circuit design data. A probability of semiconductor wafer failure is calculated.

    摘要翻译: 公开了一种用于评估半导体晶片的操作失败概率的系统和方法。 该方法包括将危险因素数据输入存储器并将多个晶片输入到半导体制造制造过程中。 选择晶片的子集以获得样本群体,并且检查样本群体的每个晶片的至少一个区域。 获得与样品群的每个晶片相关联的电路设计数据,并且识别出对特定晶片的操作具有增加的风险的一个或多个缺陷。 识别是风险因素数据,检查步骤和电路设计数据的函数。 计算半导体晶片故障的概率。

    Method for detection of hazard rate increase in time-managed lifetime data
    10.
    发明申请
    Method for detection of hazard rate increase in time-managed lifetime data 审中-公开
    检测时间管理寿命数据危险率增加的方法

    公开(公告)号:US20080065465A1

    公开(公告)日:2008-03-13

    申请号:US11519787

    申请日:2006-09-13

    CPC分类号: G06Q30/06 G06Q10/0635

    摘要: A method for detecting a hazard rate increase in time-managed lifetime data includes specifying acceptable and unacceptable levels of a shape parameter, summarizing rows of a data table by pre-specified criterion and consolidating the data table into a less refined block representation, computing bias-adjusted estimators of the shape parameter for every block in the data table, computing weights wi, i=1, 2, . . . , N corresponding to the estimators ĉi, the weights wi decreasing as the variance of ĉi increases, computing a threshold h to be applied to a set s1, s2, . . . , sN defined by s0=0, si=max[0, si-1+wi (ĉi−k)], I=1,2, . . . ,N, and applying the threshold to the set s1, s2, . . . , sN that was observed and establishing whether smax>h, where smax=max [s1, s2, . . . , sN].

    摘要翻译: 用于检测时间管理的寿命数据中的危险率增加的方法包括指定形状参数的可接受和不可接受的级别,通过预先指定的标准来总结数据表的行并将数据表合并为较不精细的块表示,计算偏差 - 数据表中每个块的形状参数的调整估计量,计算权重w i i i,i = 1,2。 。 。 ,N对应于估计器c i,随着c i i的方差而减小的权重越大,计算要应用的阈值h 到一个集合1 ,s 2 。 。 。 由s 0 0定义的s N i = 1,...,i max = 0,..., (i-1)],I = 1,2,...。 。 。 ,N,并将阈值应用于集合s 1,S 2,...。 。 。 ,观察到的,并且确定是否最小> h,其中s max = max [s 1 / s 2,..., 。 。 ,N N]。