摘要:
Advanced statistical detection of emerging trends in a process is disclosed, based on a Repeated Weighted Geometric Cumulative Sum analysis, which may be combined with time window-based estimation of proportions and related thresholds. Threshold derivation and significance computation is based on parallel simulation runs with power-exponential tail approximations. A battery of tests using the statistical theory of sequential analysis and change-point theory in combination with targets is used to evaluate non-conforming conditions in a process. Trends in fall-out rates are detected based on non-time-to-failure data that corresponds to counts of failures in consecutive time periods, with possibility of delayed input.
摘要:
An asymmetric approach is used for evaluating process control data, whereby one approach is used for determining entry into the emerging life cycle phase (i.e., presence of a new defect) and a different approach is used for detecting entry into the other life cycle phases such as cresting and recovering. An evidence curve is created from observed instance data for a particular defect, and the slope of this evidence curve is analyzed programmatically by applying one or more tests, in combination with sequential time-reversed estimation, to determine return-to-normal conditions with a desired level of confidence.
摘要:
Advanced statistical detection of emerging trends in a process is disclosed, based on a Repeated Weighted Geometric Cumulative Sum analysis, which may be combined with time window-based estimation of proportions and related thresholds. Threshold derivation and significance computation is based on parallel simulation runs with power-exponential tail approximations. A battery of tests using the statistical theory of sequential analysis and change-point theory in combination with targets is used to evaluate non-conforming conditions in a process. Trends in fall-out rates are detected based on non-time-to-failure data that corresponds to counts of failures in consecutive time periods, with possibility of delayed input.
摘要:
Determining a suitable target for an entity (such as a product) in a process control environment, based on observed process control data. A preferred embodiment organizes data in a hierarchical structure designed for automating the target-setting process; derives target “yardsticks” for various components based on this data structure; employs techniques to estimate proportions using sample-size-based trimming in conjunction with bias-correction techniques (where appropriate); and derives targets based on combining yardsticks and confidence regions for parameters that characterize component quality
摘要:
An asymmetric approach is used for evaluating process control data, whereby one approach is used for determining entry into the emerging life cycle phase (i.e., presence of a new defect) and a different approach is used for detecting entry into the other life cycle phases such as cresting and recovering. An evidence curve is created from observed instance data for a particular defect, and the slope of this evidence curve is analyzed programmatically by applying one or more tests, in combination with sequential time-reversed estimation, to determine return-to-normal conditions with a desired level of confidence.
摘要:
Determining a suitable target for an entity (such as a product) in a process control environment, based on observed process control data. A preferred embodiment organizes data in a hierarchical structure designed for automating the target-setting process; derives target “yardsticks” for various components based on this data structure; employs techniques to estimate proportions using sample-size-based trimming in conjunction with bias-correction techniques (where appropriate); and derives targets based on combining yardsticks and confidence regions for parameters that characterize component quality
摘要:
A system, method and computer program product for maintaining an infrastructure of components. The system receives structured data, unstructured data, and infrastructure data from a database. The system runs at least one statistical and optimization modeler with one or more of: the received structured data, the received unstructured data and the received infrastructure data, in order to calculate a health index of at least one component of the infrastructure. The health index represents a health attribute of the at least one component. The system establishes at least one maintenance plan of the infrastructure, based on the calculated health index. Each established maintenance plan is associated with at least one health index. The system compares health indices of the at least one established maintenance plan. The system selects a plan, among the at least one established maintenance plan, whose health index is a maximum among the compared health indices.
摘要:
A system and method of determining performance metrics for inclusion in a Service Level Agreement (SLA) between a customer and a host computing service provider. The method comprises: receiving a provisioning request from a customer including receiving computing performance requirement parameters and environmental parameters for inclusion in the SLA from the customer; deploying discovery tools to identify relevant infrastructure components based on performance metrics. Based on identification of the customer's relevant infrastructure components, probes are deployed and installed. Then, data is obtained from the probes while changing infrastructure components for simulating and assessing impact of one or more different customer scenarios for different performance policies. In one aspect, the obtained data is used to identify and implement an a priori risk sharing agreement between the customer and service provider. In a further aspect, the data obtained for simulating and assessing impact of one or more different customer policies include data for simulating and assessing different environmental policies.
摘要:
A system and method is disclosed for assessing a probability of failure of operation of a semiconductor wafer. The method includes inputting risk factor data into a memory and inputting a plurality of wafers into a semiconductor fabrication manufacturing process. A subset of wafers is selected to obtain a sample population and at least one region of each wafer of the sample population is inspected. Circuit design data associated with each wafer of the sample population is obtained and one or more defects that present an increased risk to the operation of a particular wafer are identified. The identification is a function of the risk factor data, the inspecting step and the circuit design data. A probability of semiconductor wafer failure is calculated.
摘要:
A method for detecting a hazard rate increase in time-managed lifetime data includes specifying acceptable and unacceptable levels of a shape parameter, summarizing rows of a data table by pre-specified criterion and consolidating the data table into a less refined block representation, computing bias-adjusted estimators of the shape parameter for every block in the data table, computing weights wi, i=1, 2, . . . , N corresponding to the estimators ĉi, the weights wi decreasing as the variance of ĉi increases, computing a threshold h to be applied to a set s1, s2, . . . , sN defined by s0=0, si=max[0, si-1+wi (ĉi−k)], I=1,2, . . . ,N, and applying the threshold to the set s1, s2, . . . , sN that was observed and establishing whether smax>h, where smax=max [s1, s2, . . . , sN].
摘要翻译:用于检测时间管理的寿命数据中的危险率增加的方法包括指定形状参数的可接受和不可接受的级别,通过预先指定的标准来总结数据表的行并将数据表合并为较不精细的块表示,计算偏差 - 数据表中每个块的形状参数的调整估计量,计算权重w i i i,i = 1,2。 。 。 ,N对应于估计器c i,随着c i i的方差而减小的权重越大,计算要应用的阈值h 到一个集合1 SUB>,s 2 SUB>。 。 。 由s 0 0定义的s N i = 1,...,i max = 0,..., (i-1)],I = 1,2,...。 。 。 ,N,并将阈值应用于集合s 1,S 2,...。 。 。 ,观察到的,并且确定是否最小 SUB >> h,其中s max = max [s 1 / s 2,..., 。 。 ,N N]。