公开(公告)号：US20100117295A1

公开(公告)日：2010-05-13

申请号：US12690456

申请日：2010-01-20

申请人： Akinori MIYAMOTO

发明人： Akinori MIYAMOTO

IPC分类号： B65H7/02

CPC分类号： B65H7/02 ,  B65H2511/13 ,  B65H2511/162 ,  B65H2515/712 ,  B65H2553/23 ,  B65H2553/232 ,  G01B7/087 ,  G07D7/026 ,  G07D7/164 ,  B65H2220/03 ,  B65H2220/01

摘要： A paper thickness detecting apparatus 300 includes a first sensor 301 and a second sensor 302 in which the electrostatic capacitance changes when a piece of paper 304 such as a bank note or a piece of copying paper is inserted, and a thickness detecting unit 303 for detecting the thickness of the piece of paper 304 from the signals obtained from the respective first sensor 301 and the second sensor 302, in order to provide a paper thickness detecting apparatus that can reliably detect a foreign object adhered to the paper.

摘要翻译： 纸厚度检测装置300包括第一传感器301和第二传感器302，其中插入诸如纸币或复印纸的一张纸304时静电电容发生变化;厚度检测单元303，用于检测 从相应的第一传感器301和第二传感器302获得的信号中的纸张304的厚度，以提供能够可靠地检测粘附到纸上的异物的纸张厚度检测装置。

公开(公告)号：US20110235046A1

公开(公告)日：2011-09-29

申请号：US13070024

申请日：2011-03-23

申请人： Kazunori MARUYAMA ,  Shinya HASEGAWA ,  Akinori MIYAMOTO ,  Norihiko ITANI

发明人： Kazunori MARUYAMA ,  Shinya HASEGAWA ,  Akinori MIYAMOTO ,  Norihiko ITANI

IPC分类号： G01J3/45

CPC分类号： G02B21/14 ,  G02B21/0004

摘要： An imaging apparatus includes an optical source configured to emit an electromagnetic wave, a wave dividing unit configured to divide the wave from the optical source into a first and a second wave beam, a probe optical source configured to emit a probe beam, a probe-beam dividing unit configured to divide the probe beam into a first and a second probe beam, a first crystal on which the first crystal is irradiated through an object and the first probe beam is incident, a second crystal on which the second crystal is irradiated through an object and the second probe beam is incident, an interference unit configured to allow the first probe beam from the first crystal to interfere with the second probe beam from the second crystal, and an image pickup device configured to capture an interference figure between the first and the second probe beam.

摘要翻译： 一种成像装置，包括：被配置为发射电磁波的光源;波分割部，被配置为将来自光源的波分成第一和第二波束;被配置为发射探测光束的探测光源; 光束分割单元，被配置为将探测光束分成第一和第二探测光束，第一晶体，其上通过物体照射第一晶体，并且第一探测光束入射;第二晶体，其上照射第二晶体的第二晶体 物体和第二探测光束入射;干涉单元，被配置为允许来自第一晶体的第一探测光束与来自第二晶体的第二探测光束干涉;以及图像拾取器件，被配置为捕获第一 和第二探测光束。

公开(公告)号：US20110309572A1

公开(公告)日：2011-12-22

申请号：US13223699

申请日：2011-09-01

申请人： Akinori MIYAMOTO

发明人： Akinori MIYAMOTO

IPC分类号： B65H7/12

CPC分类号： B65H7/02 ,  B65H2511/13 ,  B65H2511/162 ,  B65H2515/712 ,  B65H2553/23 ,  B65H2553/232 ,  G01B7/087 ,  G07D7/026 ,  G07D7/164 ,  B65H2220/03 ,  B65H2220/01

摘要： A paper thickness detecting apparatus includes a first sensor and a second sensor in which the electrostatic capacitance changes when a piece of paper such as a bank note or a piece of copying paper is inserted, and a thickness detecting unit for detecting the thickness of the piece of paper from the signals obtained from the respective first sensor and the second sensor, in order to provide a paper thickness detecting apparatus that can reliably detect a foreign object adhered to the paper.

摘要翻译： 纸厚度检测装置包括第一传感器和第二传感器，当插入诸如纸币或复印纸的一张纸时，静电电容发生变化;以及厚度检测单元，用于检测该片的厚度 从第一传感器和第二传感器获得的信号中的纸张，以便提供能够可靠地检测附着在纸张上的异物的纸张厚度检测装置。