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公开(公告)号:US10082656B2
公开(公告)日:2018-09-25
申请号:US15471538
申请日:2017-03-28
申请人: OLYMPUS CORPORATION
发明人: Takaaki Tanaka
CPC分类号: G02B21/0092 , G02B5/3083 , G02B21/086 , G02B21/14 , G02B27/281 , G02B27/286
摘要: A lamellar bone observation microscope includes: a light source; a condenser lens for focusing light emitted by the light source onto a sample; an objective lens on an opposite side of the sample from the condenser lens; a first polarizing plate between the light source and the condenser lens to pass only a polarization component of the light emitted by the light source; a second polarizing plate configured to pass only a polarization component of the light passed through the sample in accordance with a relative positional relationship with the first polarizing plate; a first wave plate between the first polarizing plate and the condenser lens to introduce a phase difference of λ/4 in a γ direction of the light passed through the first polarizing plate; and a second wave plate for introducing a phase difference of λ/4 in a γ direction of the light passed through the objective lens.
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公开(公告)号:US10067328B2
公开(公告)日:2018-09-04
申请号:US14132777
申请日:2013-12-18
申请人: NIKON CORPORATION
发明人: Yumiko Ouchi
CPC分类号: G02B21/0092 , G02B6/2706 , G02B6/2848 , G02B21/14 , G02B21/16 , G02B21/367 , H04N5/2256
摘要: An illumination optical system includes: a beam splitter located near a conjugate position of a specimen and configured to split beams from a light source into a plurality of groups of beams having different splitting directions around an optical axis; a beam selector configured to select and transmit one group of beams from the plurality of groups of beams and that is rotatable with respect to the optical axis; and a ½ wavelength plate located near the beam selector and rotatable about the optical axis. The rotation angles of the ½ wavelength plate and of the beam selector about the optical axis are respectively set so that the polarization direction of the beam which has passed through the ½ wavelength plate is perpendicular to the splitting direction of the one group of beams that has been selected by the beam selector and split by the beam splitter.
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公开(公告)号:US20180209905A1
公开(公告)日:2018-07-26
申请号:US15834230
申请日:2017-12-07
发明人: Yoshinori IKETAKI , Hideaki KANOU
CPC分类号: G01N21/636 , G01N21/65 , G01N2021/637 , G01N2021/653 , G01N2021/655 , G02B6/0006 , G02B6/06 , G02B6/4298 , G02B21/0032 , G02B21/0048 , G02B21/0076 , G02B21/14 , G02B27/58
摘要: A super-resolution microscope includes an illuminator that irradiates illumination beams of colors of different wavelengths through an objective lens onto a sample while causing the illumination beams to overlap at least spatially and a detector that detects a signal beam generated by the sample through irradiation with the illumination beams. As the illumination beams, the illuminator irradiates first and second illumination beams onto the sample from the same direction. The first illumination beam includes multiple wavelengths or monochromatic light for inducing a nonlinear optical effect in the sample. The second illumination beam has a different wavefront distribution on a converging surface of the objective lens or a different spatial distribution of an electrical field vector than the first illumination beam and suppresses induction of the nonlinear optical effect. The detector detects a signal beam generated by the sample as a result of the nonlinear optical effect.
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公开(公告)号:US10001405B2
公开(公告)日:2018-06-19
申请号:US14784744
申请日:2014-03-20
发明人: Yasuhiro Awatsuji , Peng Xia
CPC分类号: G01J1/0429 , G01B11/24 , G01J1/44 , G01J2009/002 , G02B21/0016 , G02B21/14 , H01J2237/26
摘要: A complex amplitude information measurement apparatus (10) according to the present invention includes pixel sensor groups for generating a difference from one pixel sensor group to another in the optical distance of object light traveling from a measurement object (100); a camera (15) provided with an image sensor for recording, with a single-shot exposure, the object light that has passed through or been reflected from the pixel sensor groups to obtain intensity information of the measurement object; and a computer (16) for computing, on the basis of the intensity information, phase information of the measurement object (100).
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公开(公告)号:US09983399B2
公开(公告)日:2018-05-29
申请号:US15055222
申请日:2016-02-26
发明人: Yang Liu , Hoa Vinh Pham , Shikhar Fnu
IPC分类号: G06K9/00 , G02B21/36 , G01N33/483 , G02B21/12 , G02B21/14 , H04N13/00 , G02B21/00 , G06T7/33
CPC分类号: G02B21/367 , G01N33/4833 , G02B21/0056 , G02B21/12 , G02B21/14 , G06T7/337 , G06T2207/10028 , G06T2207/10056 , G06T2207/30024 , H04N13/128
摘要: Provided are systems, methods, and other embodiments associated with depth-resolved spatial-domain low-coherence quantitative phase microscopy for high-throughput analysis of 3D nanoscale architectural alterations in unstained tissue and cells. A spatial-domain low-coherence quantitative phase microscopy apparatus includes a drOPD mapping module, a transmission phase imaging module, and a bright-field and transmission phase imaging module. The drOPD mapping module includes a reflection-mode low-coherence spectral interferometry for drOPD mapping of unstained tissue. The transmission phase imaging module includes transmission quantitative phase imaging of unstained and stained tissue and produce an image registration reference. The bright-field and transmission phase imaging module includes bright-field imaging of H&E-stained tissue for nuclei identification and pathology correlation.
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公开(公告)号:US09977229B2
公开(公告)日:2018-05-22
申请号:US14859208
申请日:2015-09-18
CPC分类号: G02B21/002 , G01B9/02002 , G01B9/02007 , G01B9/02009 , G01B9/02048 , G01B9/02057 , G01B9/0209 , G01B9/04 , G02B21/0016 , G02B21/14 , G02B21/26 , G02B26/007
摘要: In an inner layer measurement method, first irradiation light and second irradiation light having a peak wavelength longer than that of the first irradiation light are formed by changing at least one of a position where light emitted from a lamp is transmitted through a short pass filter and a position where light emitted from a lamp is transmitted through a long pass filter. Then, a first XY sectional surface of a semitransparent body is measured by irradiating the first XY sectional surface with the first irradiation light. A second XY sectional surface positioned on a layer deeper than the first XY sectional surface is measured by irradiating the second XY sectional surface with the second irradiation light. Each of the short pass filter and the long pass filter can transmit the light and has properties of changing a cutoff wavelength according to the position where the light is transmitted.
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公开(公告)号:US20180122092A1
公开(公告)日:2018-05-03
申请号:US15572349
申请日:2016-05-13
发明人: Lars Stoppe , Lars Omlor
CPC分类号: G06T7/586 , G02B21/06 , G02B21/14 , G02B21/367 , G06T5/003 , G06T5/50 , G06T2207/10056 , G06T2207/10152 , G06T2207/20041
摘要: Methods and apparatuses in which a plurality of images are recorded at different illumination angles are provided. The plurality of images are combined in order to produce a results image with an increased depth of field.
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公开(公告)号:US20180120550A1
公开(公告)日:2018-05-03
申请号:US15565449
申请日:2016-04-08
申请人: LLTECH MANAGEMENT
CPC分类号: G02B21/125 , G01B9/02091 , G01N21/47 , G01N21/4795 , G01N2021/4709 , G02B21/0004 , G02B21/082 , G02B21/14 , G02B21/18 , G06T1/0007 , G06T5/50 , G06T2207/10101
摘要: The invention relates to a system (20) for full-field interference microscopy imaging of a three-dimensional diffusing sample (206). Said system includes: an interference device (200) including a reference arm on which a reflective surface (205) is arranged, the interference device being suitable for producing, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave, obtained by reflection of incident light waves onto a basic surface of the reflective surface (205) corresponding to said point of the imaging field, and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth, said voxel corresponding to said point of the imaging field; an acquisition device (208) suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and a processing unit (220) configured to calculate an image (IB, IC) representing temporal variations in intensity between said N two-dimensional interferometric signals.
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公开(公告)号:US20180113295A1
公开(公告)日:2018-04-26
申请号:US15850969
申请日:2017-12-21
申请人: FUJIFILM Corporation
发明人: Kenta MATSUBARA
摘要: A culture vessel that houses a culture liquid and a specimen is irradiated with pattern light having a pattern that is previously set for the culture vessel. Transmitted light transmitted through the culture liquid in the culture vessel because of the irradiation with the pattern light is detected. Optical characteristics of an adjusting optical system that adjusts refraction of light caused by the shape of the liquid surface of the culture liquid in the culture vessel are adjusted, on the basis of a detection signal based on the detected transmitted light. After the adjustment, the culture vessel is irradiated with illumination light for phase-contrast measurement, and the specimen irradiated with the illumination light is imaged.
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公开(公告)号:US09947118B2
公开(公告)日:2018-04-17
申请号:US14723341
申请日:2015-05-27
摘要: Techniques described herein are generally related to non-interferometric phase measurements of an optical signal. The various described techniques may be applied to methods, systems, devices or combinations thereof. Some methods for determining phase data of the optical signal may include transmitting the optical signal through a first optical element and obtaining first intensity data at a first focal plane of the first optical element by an optical sensor. Example methods may also include transmitting the optical signal through a second optical element. The second optical element may include a phase transformation mask. Example methods may further include obtaining a second intensity data at a second focal plane of the second optical element by the optical sensor and determining the phase data for the optical signal based on the first intensity data and the second intensity data.
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