公开(公告)号：US4129778A

公开(公告)日：1978-12-12

申请号：US815019

申请日：1977-07-12

申请人： Akira Inoue ,  Minori Oka

发明人： Akira Inoue ,  Minori Oka

IPC分类号： G01B15/02 ,  G01N23/223 ,  G01N23/20 ,  G21K1/00

CPC分类号： G01N23/223 ,  G01N2223/076

摘要： The thickness of paint or other non-metallic coating on a galvanized or other plated metal plate is measured by applying radiation to the plated and painted plate and measuring the intensities of fluorescent X-rays thereupon emitted by the plating layer and base plate respectively. The fluorescent X-rays are detected and the electric signal produced by the detector is amplified and shaped to a corresponding waveform. The output of the amplifier is fed to two single channel analyzers and the output signals of the analyzers are counted for a predetermined time period and fed to a computer which computes the thickness from the measured intensities of the emitted fluorescent X-rays.

摘要翻译： 镀锌或其他镀金属板上的涂料或其他非金属涂层的厚度是通过对镀膜和涂漆板施加辐射并分别测量由镀层和底板发射的荧光X射线的强度来测量的。 检测荧光X射线，由检测器产生的电信号被放大并成形为相应的波形。 放大器的输出被馈送到两个单通道分析器，并且分析器的输出信号被计数预定的时间段，并被馈送到计算从发射的荧光X射线的测量的强度的厚度的计算机。