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公开(公告)号：US12085606B2
公开(公告)日：2024-09-10
申请号：US17732910
申请日：2022-04-29
申请人： Albert Gaoiran
发明人： Albert Gaoiran
CPC分类号： G01R31/2849 , G01R1/0408
摘要： Various embodiments of the invention provide a system and a method for testing one or more devices under test (DUTs) and for checking one or more test setups. Each of the one or more test setups includes a test board having several sockets for receipt of a DUT. A custom hardware interface is used to electrically connect the test board, such as a burn-in board with a test system configuration having multiple modules that can be configured using a computer device and related software to provide customized testing of the DUTs. The system is scalable to accommodate any DUT having any number of channels and to provide customized testing. Results of the testing are sent to the computing device.
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公开(公告)号：US20220252662A1
公开(公告)日：2022-08-11
申请号：US17732910
申请日：2022-04-29
申请人： Albert Gaoiran
发明人： Albert Gaoiran
摘要： Various embodiments of the invention provide a system and a method for testing one or more devices under test (DUTs) and for checking one or more test setups. Each of the one or more test setups includes a test board having several sockets for receipt of a DUT. A custom hardware interface is used to electrically connect the test board, such as a burn-in board with a test system configuration having multiple modules that can be configured using a computer device and related software to provide customized testing of the DUTs. The system is scalable to accommodate any DUT having any number of channels and to provide customized testing. Results of the testing are sent to the computing device.
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公开(公告)号：US11320480B1
公开(公告)日：2022-05-03
申请号：US16531097
申请日：2019-08-04
申请人： Albert Gaoiran
发明人： Albert Gaoiran
摘要： Various embodiments of the invention provide a system and a method for testing one or more devices under test (DUTs) and for checking one or more test setups. Each of the one or more test setups includes a test board having several sockets for receipt of a DUT. A custom hardware interface is used to electrically connect the test board, such as a burn-in board with a test system configuration having multiple modules that can be configured using a computer device and related software to provide customized testing of the DUTs. The system is scalable to accommodate any DUT having any number of channels and to provide customized testing. Results of the testing are sent to the computing device.
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