公开(公告)号：US07966532B2

公开(公告)日：2011-06-21

申请号：US12414935

申请日：2009-03-31

申请人： Aldo Bottelli ,  Luca Fasoli ,  Doug Sojourner

发明人： Aldo Bottelli ,  Luca Fasoli ,  Doug Sojourner

IPC分类号： G11C29/00

CPC分类号： G11C29/812 ,  G11C29/802 ,  G11C29/82

摘要： Column redundancy data is selectively retrieved in a memory device according to a set of storage elements which is currently being accessed, such as in a read or write operation. The memory device is organized into sets of storage elements such as logical blocks, where column redundancy data is loaded from a non-volatile storage location to a volatile storage location for one or more particular blocks which are being accessed. The volatile storage location need only be large enough to store the current data entries. The size of the set of storage elements for which column redundancy data is concurrently loaded can be configured based on an expected maximum number of defects and a desired repair probability. During a manufacturing lifecycle, the size of the set can be increased as the number of defects is reduced due to improvements in manufacturing processes and materials.

摘要翻译： 根据当前正在被访问的一组存储元件，例如在读取或写入操作中，在存储器件中选择性地检索列冗余数据。 存储器设备被组织成诸如逻辑块的存储元件组，其中列冗余数据从非易失性存储位置加载到正被访问的一个或多个特定块的易失性存储位置。 易失性存储位置仅需要足够大以存储当前数据条目。 可以基于期望的最大缺陷数量和期望的修复概率来配置列冗余数据同时加载的存储元件组的大小。 在制造生命周期中，随着制造工艺和材料的改进，缺陷数量的减少可以增加组件的尺寸。

公开(公告)号：US20100107004A1

公开(公告)日：2010-04-29

申请号：US12414935

申请日：2009-03-31

申请人： Aldo Bottelli ,  Luca Fasoli ,  Doug Sojourner

发明人： Aldo Bottelli ,  Luca Fasoli ,  Doug Sojourner

IPC分类号： G06F11/20 ,  G06F12/00 ,  G06F12/16 ,  G06F12/02

CPC分类号： G11C29/812 ,  G11C29/802 ,  G11C29/82

摘要： Column redundancy data is selectively retrieved in a memory device according to a set of storage elements which is currently being accessed, such as in a read or write operation. The memory device is organized into sets of storage elements such as logical blocks, where column redundancy data is loaded from a non-volatile storage location to a volatile storage location for one or more particular blocks which are being accessed. The volatile storage location need only be large enough to store the current data entries. The size of the set of storage elements for which column redundancy data is concurrently loaded can be configured based on an expected maximum number of defects and a desired repair probability. During a manufacturing lifecycle, the size of the set can be increased as the number of defects is reduced due to improvements in manufacturing processes and materials.

摘要翻译： 根据当前正在被访问的一组存储元件，例如在读取或写入操作中，在存储器件中选择性地检索列冗余数据。 存储器设备被组织成诸如逻辑块的存储元件组，其中列冗余数据从非易失性存储位置加载到正被访问的一个或多个特定块的易失性存储位置。 易失性存储位置仅需要足够大以存储当前数据条目。 可以基于期望的最大缺陷数量和期望的修复概率来配置列冗余数据同时加载的存储元件组的大小。 在制造生命周期中，随着制造工艺和材料的改进，缺陷数量的减少可以增加组件的尺寸。