公开(公告)号：US20240238904A1

公开(公告)日：2024-07-18

申请号：US18409763

申请日：2024-01-10

Applicant: Align Technology, Inc.

Inventor： Javier Antonio García Ramírez ,  Alan Gerardo Martinez Reyes ,  Miriam Sarahi Esquivel Salas ,  Ismael Núñez Garcia ,  Rene David Alfaro ,  Shiva P. Sambu ,  Luiyi Morales Vargas ,  Fidel Castro Hernandez ,  Mario Alfonso Rito Martinez

IPC: B23K26/362 ,  A61C7/08

CPC classification number: B23K26/362 ,  A61C7/08 ,  A61C2204/00

Abstract: A method includes: identifying marking parameters associated with performance of dental appliance etching; includes identifying a first segment of marking data to be etched onto a dental appliance; causing, via dental appliance marking equipment based on the marking parameters, etching of the first segment on the dental appliance; capturing image data associated with the etching of the first segment; and causing the marking parameters to be updated based on the image data. A method includes: subsequent to dental appliances being simultaneously thermoformed via a thermoforming system in a single batch, determining dental appliance data and laser tool data; determining, based on the dental appliance data and the laser tool data, global plan data for performing laser operations of the dental appliances via laser tools; and causing, based on the global plan data via the laser tools, the laser operations of the dental appliances.