公开(公告)号：US11340295B2

公开(公告)日：2022-05-24

申请号：US17038598

申请日：2020-09-30

Applicant: Analog Devices, Inc.

Inventor： Amit Kumar Singh ,  Christopher C. McQuilkin ,  Brian Carey

IPC: G01R31/28 ,  G01R31/319 ,  G01R31/317

Abstract: A force-sense system for providing signals to, or receiving signals from, a device under test (DUT) at a first DUT node. The system can include an interface coupling first and second portions of a first force-sense measurement device, such as a parametric measurement unit. The first and second portions of the first force-sense measurement device can be provided using respective different integrated circuits, such as can comprise different semiconductor dies of different die types. In a first test mode, the interface can be configured to communicate a first DUT force signal from the first portion to the second portion of the first force-sense measurement device, and in a second test mode the interface can be configured to communicate DUT sense information, received from the DUT at the first DUT node, from the second portion to the first portion of the first force-sense measurement device.

公开(公告)号：US11313903B2

公开(公告)日：2022-04-26

申请号：US17071609

申请日：2020-10-15

Applicant: Analog Devices, Inc.

Inventor： Amit Kumar Singh ,  Christopher C. McQuilkin ,  Brian Carey

IPC: G01R31/67 ,  G01R31/317 ,  G01R31/26 ,  G01R31/319

Abstract: A force-sense system can provide signals to, or receive signals from, a device under test (DUT) at a first DUT node. The system can include output buffer circuitry configured to provide a DUT signal to the DUT in response to a force control signal at a buffer control node, and controller circuitry configured to provide the force control signal at the buffer control node. The system can include bypass circuitry configured to selectively bypass the controller circuitry and provide an auxiliary control signal at the buffer control node. The auxiliary control signal can be used for system calibration. In an example, an external calibration circuit can provide the auxiliary control signal in response to information received from the DUT.

公开(公告)号：US20220099739A1

公开(公告)日：2022-03-31

申请号：US17038598

申请日：2020-09-30

Applicant: Analog Devices, Inc.

Inventor： Amit Kumar Singh ,  Christopher C. McQuilkin ,  Brian Carey

IPC: G01R31/319 ,  G01R31/317 ,  G01R31/28

Abstract: A force-sense system for providing signals to, or receiving signals from, a device under test (DUT) at a first DUT node. The system can include an interface coupling first and second portions of a first force-sense measurement device, such as a parametric measurement unit. The first and second portions of the first force-sense measurement device can be provided using respective different integrated circuits, such as can comprise different semiconductor dies of different die types. In a first test mode, the interface can be configured to communicate a first DUT force signal from the first portion to the second portion of the first force-sense measurement device, and in a second test mode the interface can be configured to communicate DUT sense information, received from the DUT at the first DUT node, from the second portion to the first portion of the first force-sense measurement device.

公开(公告)号：US20220099738A1

公开(公告)日：2022-03-31

申请号：US17071609

申请日：2020-10-15

Applicant: Analog Devices, Inc.

Inventor： Amit Kumar Singh ,  Christopher C. McQuilkin ,  Brian Carey

IPC: G01R31/317 ,  G01R31/319 ,  G01R31/26

Abstract: A force-sense system can provide signals to, or receive signals from, a device under test (DUT) at a first DUT node. The system can include output buffer circuitry configured to provide a DUT signal to the DUT in response to a force control signal at a buffer control node, and controller circuitry configured to provide the force control signal at the buffer control node. The system can include bypass circuitry configured to selectively bypass the controller circuitry and provide an auxiliary control signal at the buffer control node. The auxiliary control signal can be used for system calibration. In an example, an external calibration circuit can provide the auxiliary control signal in response to information received from the DUT.