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公开(公告)号：US10659069B2
公开(公告)日：2020-05-19
申请号：US16220870
申请日：2018-12-14
Applicant: Analog Devices, Inc.
Inventor： Ahmed Mohamed Abdelatty Ali , Paridhi Gulati
Abstract: Analog circuits are often non-linear, and the non-linearities can hurt performance. Designers would trade off power consumption to achieve better linearity. An efficient and effective calibration technique can address the non-linearities and reduce the overall power consumption. A dither signal injected to the analog circuit can be used to expose the non-linear behavior in the digital domain. To detect the non-linearities, a counting approach is applied to isolate non-linearities independent of the input distribution. The approach is superior to and different from other approaches in many ways.
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公开(公告)号：US11159169B2
公开(公告)日：2021-10-26
申请号：US16877118
申请日：2020-05-18
Applicant: Analog Devices, Inc.
Inventor： Ahmed Mohamed Abdelatty Ali , Paridhi Gulati
Abstract: Analog circuits are often non-linear, and the non-linearities can hurt performance. Designers would trade off power consumption to achieve better linearity. An efficient and effective calibration technique can address the non-linearities and reduce the overall power consumption. A dither signal injected to the analog circuit can be used to expose the non-linear behavior in the digital domain. To detect the non-linearities, a counting approach is applied to isolate non-linearities independent of the input distribution. The approach is superior to and different from other approaches in many ways.
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公开(公告)号：US10763878B2
公开(公告)日：2020-09-01
申请号：US16364134
申请日：2019-03-25
Applicant: Analog Devices, Inc.
Inventor： Ahmed Mohamed Abdelatty Ali , Paridhi Gulati , Bryan S. Puckett , Huseyin Dinc
Abstract: Background calibration techniques can effectively to correct for memory, kick-back, and order-dependent errors in interleaved switched-capacitor track-and-hold (T/H) circuits and amplifiers. The techniques calibrate for errors in both the track/sample phase and the hold-phase, and account for the effects of interleaving, buffer/amplifier sharing, incomplete resetting, incomplete settling, chopping, and randomization on the offset, gain, memory, and kick-back errors. Moreover, the techniques can account for order-dependent and state-dependent hold-phase non-linearities. By correcting for these errors, the proposed techniques improve the noise performance, linearity, gain/offset matching, frequency response (and bandwidth), and order-dependence errors. The techniques also help increase the speed (sample rate and bandwidth) and linearity of T/H circuits and amplifiers while simplifying the analog circuitry and clocking needed. These techniques comprehensively account for various memory, kick-back, and order-dependent effects in a unified framework.
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公开(公告)号：US10547319B2
公开(公告)日：2020-01-28
申请号：US16138942
申请日：2018-09-21
Applicant: Analog Devices, Inc.
Inventor： Ahmed Mohamed Abdelatty Ali , Paridhi Gulati
Abstract: Multi-step ADCs performs multi-step conversion by generating a residue for a subsequent stage to digitize. To generate a residue, a stage in the multi-step ADC would reconstruct the input signal to the stage using a feedforward digital to analog converter (DAC). Non-linearities in the DAC can directly affect the overall performance of the multi-step ADC. To reduce power consumption and complexity of analog circuit design, digital background calibration schemes are implemented to address the non-linearities. The non-linearities that the calibration schemes address can include reference, DAC, and quantization non-linearities.
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