Measurement system
    1.
    发明授权

    公开(公告)号:US11193803B2

    公开(公告)日:2021-12-07

    申请号:US16262579

    申请日:2019-01-30

    Abstract: Various examples are directed to systems and methods for managing a sensor. A measurement system may receive, from a host device, a first register map describing a first configuration of a measurement system. The first configuration may be associated with a first sensor. The measurement system may compare the first register map to an error rule set indicating inconsistent register map arrangements. After comparing the first register map to the error rule set, the measurement system may configure a switch matrix of the measurement system to sample the first sensor according to the first configuration of the measurement system. The measurement system may receive a plurality of samples from a first sensor and generate first digital measurement data based at least in part on the plurality of samples.

    ADC INPUT CIRCUIT SENSING FOR FAULT DETECTION

    公开(公告)号:US20180284178A1

    公开(公告)日:2018-10-04

    申请号:US15937363

    申请日:2018-03-27

    Abstract: A fault detection scheme can include use of a relatively high injection impedance between an input port for analog measurements from a sensor and a stimulus generation circuit controlled in coordination with analog measurement. The stimulus generation circuit can provide a stimulus signal through the injection impedance. A magnitude of the injection impedance can be specified relative to a source impedance associated with a source (e.g., a sensor or other device) coupled to the input port. For example, a magnitude of the injection impedance can be specified to be larger than the source impedance or the injection impedance magnitude can be specified to be a multiple of the source impedance.

    MEASUREMENT SYSTEM
    3.
    发明申请
    MEASUREMENT SYSTEM 审中-公开

    公开(公告)号:US20190242730A1

    公开(公告)日:2019-08-08

    申请号:US16262676

    申请日:2019-01-30

    CPC classification number: G01D18/00

    Abstract: Various examples are directed to methods and system of managing a sensor. A measurement system may receive from the host device, a first register map describing a first configuration of the measurement system for the first sensor. The first configuration may indicate a first measurement frequency for the first sensor. The measurement system may configure a switch matrix to provide a first excitation signal to the first sensor. The measurement system may configure the switch matrix to connect an analog-to-digital converter (ADC) of the measurement system to the first sensor. The measurement system may sample a first raw sensor signal from the first sensor with the ADC at a first measurement frequency described by the first configuration. The measurement system may generate first digital measurement data based at least in part on the first raw sensor signal and send the first digital measurement data to the host device.

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