公开(公告)号：US10218268B1

公开(公告)日：2019-02-26

申请号：US15936122

申请日：2018-03-26

Applicant: Analog Devices Global Unlimited Company

Inventor： Maitrey Kamble ,  Michael C. W. Coln ,  Vinayak Mukund Kulkarni

IPC: H03M1/12 ,  H02M3/07 ,  H03M1/46

Abstract: The present disclosure relates to a voltage reference circuit and a method of providing a voltage reference. The voltage reference circuit uses a switched capacitor arrangement to move charge between capacitors during different phases of operation of the circuit to which the voltage reference is being provided. The circuit being provided with a voltage reference may be an analog-to-digital converter (ADC). A reservoir capacitor is used to supply the reference voltage. During a phase in which no voltage reference is required, charge is shared between the capacitors of the switched capacitor arrangement, in order to boost the charge on the reservoir capacitor. After charge sharing, the reservoir capacitor is topped up with an output from a reference buffer. The reservoir capacitor may then be used again in the next conversion phase.

公开(公告)号：US09935648B1

公开(公告)日：2018-04-03

申请号：US15692695

申请日：2017-08-31

Applicant: Analog Devices Global

Inventor： Maitrey Kamble ,  Arvind Madan ,  Sandeep Monangi

IPC: H03M1/46 ,  H03M1/80

CPC classification number: H03M1/466 ,  H03M1/462 ,  H03M1/804

Abstract: To reduce the overall reference charge needed to perform operations, analog-to-digital converters can maintain reference voltage connections of the bit trial capacitors of the digital-to-analog converter (DAC) from the end of a current conversion to just prior to the beginning of the next acquisition phase. At the start of the next acquisition phase, the bottom plates of the bit trial capacitors of the DAC can be shorted to generate a common mode voltage. As the conversion phase begins, the bottom plates of the sampling capacitors are disconnected from the input voltage and the bottom plates of each bit trial capacitor are shorted to generate input common-mode voltage. As bit trials progress, the shorts between the bottom plates of the bit trial capacitors are removed and the bit trial results are applied to the bottom plates of the bit trial capacitors.