公开(公告)号：US07404109B2

公开(公告)日：2008-07-22

申请号：US10736438

申请日：2003-12-15

Applicant: Andrew S. Hildebrant ,  Domenico Chindamo

Inventor： Andrew S. Hildebrant ,  Domenico Chindamo

IPC: G11B20/20

CPC classification number: G01R31/318335

Abstract: Systems and methods for adaptively compressing test data are disclosed. One such method comprises the steps of examining a test data file that includes a first plurality of data units corresponding to a first plurality of DUT pins and a second plurality of data units corresponding to a second plurality of DUT pins, compressing the first plurality of data units using a first compression technique, and compressing the second plurality of data units using a second compression technique.

Abstract translation: 公开了用于自适应压缩测试数据的系统和方法。 一种这样的方法包括以下步骤：检查包括对应于第一多个DUT引脚的第一多个数据单元和对应于第二多个DUT引脚的第二多个数据单元的测试数据文件，压缩第一多个数据 使用第一压缩技术的单元，以及使用第二压缩技术来压缩第二多个数据单元。

公开(公告)号：US20060212770A1

公开(公告)日：2006-09-21

申请号：US11342177

申请日：2006-01-27

Applicant: Martin Fischer ,  Domenico Chindamo

Inventor： Martin Fischer ,  Domenico Chindamo

IPC: G01R31/28 ,  G06F11/00

CPC classification number: G01R31/318547 ,  G01R31/318335 ,  G01R31/318371

Abstract: A device under test—DUT—, comprising the steps of receiving a first data sequence from the DUT in response to a first stimulus signal, wherein the data of a plurality of internal data sequences of the DUT is compressed into the first data sequence, comparing the first data sequence with expected data and for detecting errors in the first data sequence, and providing a second stimulus signal to the DUT in order to instruct the DUT to generate a second data sequence that comprises uncompressed data of the plurality of the internal data sequences at the positions where the errors have been detected.

公开(公告)号：US08473796B2

公开(公告)日：2013-06-25

申请号：US11342177

申请日：2006-01-27

Applicant: Martin Fischer ,  Domenico Chindamo

Inventor： Martin Fischer ,  Domenico Chindamo

IPC: G01R31/28

CPC classification number: G01R31/318547 ,  G01R31/318335 ,  G01R31/318371

Abstract: A device under test—DUT—, comprising the steps of receiving a first data sequence from the DUT in response to a first stimulus signal, wherein the data of a plurality of internal data sequences of the DUT is compressed into the first data sequence, comparing the first data sequence with expected data and for detecting errors in the first data sequence, and providing a second stimulus signal to the DUT in order to instruct the DUT to generate a second data sequence that comprises uncompressed data of the plurality of the internal data sequences at the positions where the errors have been detected.

Abstract translation: 一种被测器件，包括以下步骤：响应于第一激励信号从DUT接收第一数据序列，其中DUT的多个内部数据序列的数据被压缩为第一数据序列，比较 所述第一数据序列具有期望数据和用于检测所述第一数据序列中的错误，以及向所述DUT提供第二刺激信号，以便指示所述DUT产生包括所述多个所述内部数据序列的未压缩数据的第二数据序列 在检测到错误的位置。

公开(公告)号：US20060075317A1

公开(公告)日：2006-04-06

申请号：US10959857

申请日：2004-10-05

Applicant: Domenico Chindamo ,  Ariadne Salagianis

Inventor： Domenico Chindamo ,  Ariadne Salagianis

IPC: G01R31/28

CPC classification number: G01R31/318547 ,  G01R31/31921

Abstract: In one embodiment, an electronic device is tested using automated test equipment (ATE) by 1) storing different vectors of scan load data in memory of the ATE; 2) storing a scan unload subroutine in the memory of the ATE; 3) stimulating the electronic device by retrieving the different vectors of scan load data and applying them to the electronic device; and 4) capturing responses to the different vectors by repeatedly calling the scan unload subroutine, and in response thereto, storing different vectors of scan unload data in the memory.

Abstract translation: 在一个实施例中，使用自动化测试设备（ATE）测试电子设备，1）将不同的扫描负载数据向量存储在ATE的存储器中; 2）将扫描卸载子程序存储在ATE的存储器中; 3）通过检索扫描负载数据的不同矢量并将其应用于电子设备来刺激电子设备; 以及4）通过重复地调用所述扫描卸载子程序捕获对所述不同向量的响应，并且响应于此，将不同的扫描卸载数据向量存储在所述存储器中。

公开(公告)号：US07321999B2

公开(公告)日：2008-01-22

申请号：US10959857

申请日：2004-10-05

Applicant: Domenico Chindamo ,  Ariadne Salagianis

Inventor： Domenico Chindamo ,  Ariadne Salagianis

IPC: G01R31/28

CPC classification number: G01R31/318547 ,  G01R31/31921

Abstract: In one embodiment, an electronic device is tested using automated test equipment (ATE) by 1) storing different vectors of scan load data in memory of the ATE; 2) storing a scan unload subroutine in the memory of the ATE; 3) stimulating the electronic device by retrieving the different vectors of scan load data and applying them to the electronic device; and 4) capturing responses to the different vectors by repeatedly calling the scan unload subroutine, and in response thereto, storing different vectors of scan unload data in the memory.

Abstract translation: 在一个实施例中，使用自动化测试设备（ATE）测试电子设备，1）将不同的扫描负载数据向量存储在ATE的存储器中; 2）将扫描卸载子程序存储在ATE的存储器中; 3）通过检索扫描负载数据的不同矢量并将其应用于电子设备来刺激电子设备; 以及4）通过重复地调用所述扫描卸载子程序捕获对所述不同向量的响应，并且响应于此，将不同的扫描卸载数据向量存储在所述存储器中。

公开(公告)号：US07254760B2

公开(公告)日：2007-08-07

申请号：US10959856

申请日：2004-10-05

Applicant: Domenico Chindamo ,  Ariadne Salagianis

Inventor： Domenico Chindamo ,  Ariadne Salagianis

IPC: G01R31/28 ,  G06F11/00

CPC classification number: G01R31/31921 ,  G01R31/318547

Abstract: In one embodiment, a method provides scan patterns to an electronic device having BIST hardware. The BIST hardware has production and diagnostic test modes, and the device outputs one or more response signatures in the production test mode and outputs raw response data in the diagnostic test mode. In production test mode, the method uses ATE to 1) provide a first series of scan test patterns to the BIST hardware, and 2) capture and compare response signatures to expected response signatures, to identify a number of failing scan test patterns. The method then uses the ATE to identify a number of unique labels associated with the failing patterns. In diagnostic test mode, the method uses the ATE to 1) provide a second series of scan test patterns to the BIST hardware, and 2) capture raw response data. The scan test patterns in the second series correspond to the identified labels.

Abstract translation: 在一个实施例中，一种方法向具有BIST硬件的电子设备提供扫描模式。 BIST硬件具有生产和诊断测试模式，设备在生产测试模式下输出一个或多个响应签名，并在诊断测试模式下输出原始响应数据。 在生产测试模式下，该方法使用ATE 1）向BIST硬件提供第一系列扫描测试模式，以及2）将响应签名与预期响应签名进行捕获和比较，以识别出许多故障扫描测试模式。 然后，该方法使用ATE来识别与失败模式相关联的许多唯一标签。 在诊断测试模式下，该方法使用ATE 1）向BIST硬件提供第二系列扫描测试模式，以及2）捕获原始响应数据。 第二系列中的扫描测试图案对应于所识别的标签。

公开(公告)号：US20060075316A1

公开(公告)日：2006-04-06

申请号：US10959856

申请日：2004-10-05

Applicant: Domenico Chindamo ,  Ariadne Salagianis

Inventor： Domenico Chindamo ,  Ariadne Salagianis

IPC: G01R31/28 ,  G06F11/00

CPC classification number: G01R31/31921 ,  G01R31/318547

Abstract: In one embodiment, a method provides scan patterns to an electronic device having BIST hardware. The BIST hardware has production and diagnostic test modes, and the device outputs one or more response signatures in the production test mode and outputs raw response data in the diagnostic test mode. In production test mode, the method uses ATE to 1) provide a first series of scan test patterns to the BIST hardware, and 2) capture and compare response signatures to expected response signatures, to identify a number of failing scan test patterns. The method then uses the ATE to identify a number of unique labels associated with the failing patterns. In diagnostic test mode, the method uses the ATE to 1) provide a second series of scan test patterns to the BIST hardware, and 2) capture raw response data. The scan test patterns in the second series correspond to the identified labels.

Abstract translation: 在一个实施例中，一种方法向具有BIST硬件的电子设备提供扫描模式。 BIST硬件具有生产和诊断测试模式，设备在生产测试模式下输出一个或多个响应签名，并在诊断测试模式下输出原始响应数据。 在生产测试模式下，该方法使用ATE 1）向BIST硬件提供第一系列扫描测试模式，以及2）将响应签名与预期响应签名进行捕获和比较，以识别出许多故障扫描测试模式。 然后，该方法使用ATE来识别与失败模式相关联的许多唯一标签。 在诊断测试模式下，该方法使用ATE 1）向BIST硬件提供第二系列扫描测试模式，以及2）捕获原始响应数据。 第二系列中的扫描测试图案对应于所识别的标签。