-
公开(公告)号:US12154480B2
公开(公告)日:2024-11-26
申请号:US18184592
申请日:2023-03-15
Applicant: Apple Inc.
Inventor: Jenny Hu , Chaohao Wang , Christopher E Glazowski , Clint M Perlaki , David R Manly , Feng Wen , Graeme M Williams , Hei Kam , Hyun H Boo , Kevin J Choboter , Kyounghwan Kim , Lu Yan , Mahesh B Chappalli , Mark T Winkler , Na Zhu , Peter F Holland , Tong Chen , Warren S Rieutort-Louis , Wenrui Cai , Ximeng Guan , Yingying Tang , Yuchi Che
IPC: G09G3/3233 , G06F3/042 , G09G3/20 , G09G3/34 , G06F3/041
Abstract: A light emitter that operates through a display may cause display artifacts, even when the light emitter operates using non-visible wavelengths. Display artifacts caused by a light emitter that operates through a display may be referred to as emitter artifacts. To mitigate emitter artifacts, operating conditions for a display frame may be used to determine an optimal firing time for the light emitter during that display frame. The operating conditions used to determine the optimal firing time may include emitter operating conditions, display content statistics, display brightness, temperature, and refresh rate. Operating conditions from one or more previous frames may be stored in a frame buffer and may be used to help determine the optimal firing time for the light emitter during a display frame. Pixel values for the display may be modified to mitigate emitter artifacts.
-
公开(公告)号:US20240363088A1
公开(公告)日:2024-10-31
申请号:US18611276
申请日:2024-03-20
Applicant: Apple Inc.
Inventor: Tong Chen , Wenrui Cai , Jenny Hu , Clint M Perlaki
IPC: G09G5/10
CPC classification number: G09G5/10 , G09G2310/08 , G09G2360/144 , G09G2360/145
Abstract: A light emitter that operates through a display may cause display artifacts, even when the light emitter operates using non-visible wavelengths. To determine whether the light emitter has caused these artifacts, a display light sensor under the display may measure backside light leakage from the display. Based on the measured backside light leakage, the display light sensor or control circuitry may determine whether artifacts in the display exceed a predetermined acceptable artifact range. If the artifacts exceed this range, the artifacts may be mitigated. To mitigate the artifacts, the light emitter and/or the display may be adjusted. For example, the timing and/or dosage of the light emitter, the acceptable artifact range, and/or the timing of display content may be adjusted. In this way, the display light sensor may be used to form a closed-loop system to determine whether artifacts are present in the display and to mitigate those artifacts.
-
公开(公告)号:US20230410718A1
公开(公告)日:2023-12-21
申请号:US18184592
申请日:2023-03-15
Applicant: Apple Inc.
Inventor: Jenny Hu , Chaohao Wang , Christopher E Glazowski , Clint M Perlaki , David R Manly , Feng Wen , Graeme M Williams , Hei Kam , Hyun H Boo , Kevin J Choboter , Kyounghwan Kim , Lu Yan , Mahesh B Chappalli , Mark T Winkler , Na Zhu , Peter F Holland , Tong Chen , Warren S Rieutort-Louis , Wenrui Cai , Ximeng Guan , Yingying Tang , Yuchi Che
CPC classification number: G09G3/2096 , G06F3/042 , G09G2360/16 , G09G2320/0295 , G06F3/0412
Abstract: A light emitter that operates through a display may cause display artifacts, even when the light emitter operates using non-visible wavelengths. Display artifacts caused by a light emitter that operates through a display may be referred to as emitter artifacts. To mitigate emitter artifacts, operating conditions for a display frame may be used to determine an optimal firing time for the light emitter during that display frame. The operating conditions used to determine the optimal firing time may include emitter operating conditions, display content statistics, display brightness, temperature, and refresh rate. Operating conditions from one or more previous frames may be stored in a frame buffer and may be used to help determine the optimal firing time for the light emitter during a display frame. Pixel values for the display may be modified to mitigate emitter artifacts.
-
-