公开(公告)号：US20200018942A1

公开(公告)日：2020-01-16

申请号：US16583244

申请日：2019-09-25

Applicant: BAE Systems Information and Electronic Systems Integration Inc.

Inventor： Richard Rochford ,  Tristan J. Baldwin ,  Edward L. Brabant, JR. ,  Charles H. Mazel ,  Michael J. Meade ,  Matteo Forgione

IPC: G02B21/16 ,  G03B21/20 ,  G02B21/36

Abstract: The present disclosure relates to a system and technique for a system for detecting fluorescing particles on a target comprising a viewing device configured to view the target and a light subsystem configured to illuminate the target, wherein the target includes a fluorescing particle that effectuates the fluorescent feedback second wavelength. In one example, no additional fluorescing agent or additive, other than the fluorescing particle, is added to the target. A passive cooling subsystem is configured to prevent overheating of the system without expending additional energy resources. The system includes a filter in operative communication with the viewing device having a selected filter wavelength configured to allow light to pass that is greater than the first wavelength and at least one non-transitory computer readable storage medium having instructions encoded thereon.

公开(公告)号：US20180313757A1

公开(公告)日：2018-11-01

申请号：US15583480

申请日：2017-05-01

Applicant: BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC.

Inventor： Richard Rochford ,  Tristan J. Baldwin ,  Edward L. Brabant, JR. ,  Charles H. Mazel ,  Michael J. Meade

IPC: G01N21/64 ,  G02B21/16 ,  G01N21/88 ,  G01N21/94 ,  G02B21/00 ,  H01L21/67 ,  H01L21/66 ,  H01L21/02

CPC classification number: G01N21/6447 ,  G01N21/8803 ,  G01N21/8806 ,  G01N21/94 ,  G01N2021/95638 ,  G02B5/208 ,  G02B21/0016 ,  G02B21/16 ,  G02B21/24

Abstract: The present disclosure relates to a system and method utilizing a light source coupled with a viewing device to detect contaminant(s) on an electronic circuit board. This fluorescence microscopy apparatus can be easily integrated into a bench top stereoscope or microscope and does not require the use of expensive and destructive analytical techniques. Typically, blue light is used in conjunction with a filter to detect contamination from cured epoxy resins and many other contaminants on gold bond pads, wires, pads, or other electrically conductive elements on the electronic circuit.

公开(公告)号：US11067784B2

公开(公告)日：2021-07-20

申请号：US16583244

申请日：2019-09-25

Applicant: BAE Systems Information and Electronic Systems Integration Inc.

Inventor： Richard Rochford ,  Tristan J. Baldwin ,  Edward L. Brabant, Jr. ,  Charles H. Mazel ,  Michael J. Meade ,  Matteo Forgione

IPC: G02B21/16 ,  G03B21/20 ,  G02B21/36 ,  G02B21/28

Abstract: The present disclosure relates to a system and technique for a system for detecting fluorescing particles on a target comprising a viewing device configured to view the target and a light subsystem configured to illuminate the target, wherein the target includes a fluorescing particle that effectuates the fluorescent feedback second wavelength. In one example, no additional fluorescing agent or additive, other than the fluorescing particle, is added to the target. A passive cooling subsystem is configured to prevent overheating of the system without expending additional energy resources. The system includes a filter in operative communication with the viewing device having a selected filter wavelength configured to allow light to pass that is greater than the first wavelength and at least one non-transitory computer readable storage medium having instructions encoded thereon.

公开(公告)号：US10466176B2

公开(公告)日：2019-11-05

申请号：US15583480

申请日：2017-05-01

Applicant: BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC.

Inventor： Richard Rochford ,  Tristan J. Baldwin ,  Edward L. Brabant, Jr. ,  Charles H. Mazel ,  Michael J. Meade

IPC: G01N21/64 ,  G02B21/16 ,  G01N21/88 ,  G02B21/00 ,  H01L21/67 ,  H01L21/66 ,  H01L21/02 ,  G01N21/94 ,  G02B21/24 ,  G02B5/20 ,  G01N21/956

Abstract: The present disclosure relates to a system and method utilizing a light source coupled with a viewing device to detect contaminant(s) on an electronic circuit board. This fluorescence microscopy apparatus can be easily integrated into a bench top stereoscope or microscope and does not require the use of expensive and destructive analytical techniques. Typically, blue light is used in conjunction with a filter to detect contamination from cured epoxy resins and many other contaminants on gold bond pads, wires, pads, or other electrically conductive elements on the electronic circuit.