公开(公告)号：US20230153511A1

公开(公告)日：2023-05-18

申请号：US17884899

申请日：2022-08-10

Applicant: BEIJING BAIDU NETCOM SCIENCE TECHNOLOGY CO., LTD.

Inventor： Xin JIN

IPC: G06F30/398

CPC classification number: G06F30/398

Abstract: There is provided a regression test method, an electronic device and a storage medium, and relates to the field of artificial intelligence, such as artificial intelligence chips, cloud computing, intelligent voices, or the like. The method includes: when execution of any regression test is completed, determining a to-be-adjusted test case from test cases according to a current test result; and adjusting a randomization weight corresponding to a data range randomized by the to-be-adjusted test case in a current test.

公开(公告)号：US20230168723A1

公开(公告)日：2023-06-01

申请号：US17893415

申请日：2022-08-23

Applicant: BEIJING BAIDU NETCOM SCIENCE TECHNOLOGY CO., LTD.

Inventor： Dongxin LI ,  Xin JIN

IPC: G06F1/20

CPC classification number: G06F1/20

Abstract: A thermal relief implementing method and apparatus, an electronic device and a storage medium, which relate to the field of artificial intelligence, such as artificial intelligence chips, are disclosed. The method may include: determining a number of reflow holes for any pin, and determining a number of connection layers for thermal relief connection according to the number of the reflow holes; adjusting at least one parameter of the number of the reflow holes, the number of the connection layers, or widths of connection points of at least one layer until predetermined heat dissipation constraint and impedance design requirement are met; and taking current parameter values as required thermal-relief design parameters.

公开(公告)号：US20240412807A1

公开(公告)日：2024-12-12

申请号：US18027953

申请日：2022-06-28

Applicant: BEIJING BAIDU NETCOM SCIENCE TECHNOLOGY CO., LTD.

Inventor： Xin JIN

IPC: G11C29/56 ,  G06F30/3308

Abstract: The present disclosure provides a method and apparatus of mirroring storage implementation for a memory model, and a storage medium, and relates to the field of artificial intelligence (AI) such as AI chips and intelligent voice. The method may include: acquiring, in response to a data update behavior occurring in a memory in a device under test (DUT), update behavior information of the update, the update behavior information being extracted from a bus; and correspondingly updating data stored in the memory model according to the update behavior information. By use of the solutions of the present disclosure, valid memory verification and the like can be achieved.