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公开(公告)号:US20240310243A1
公开(公告)日:2024-09-19
申请号:US18398607
申请日:2023-12-28
Applicant: BEIJING INSTITUTE OF TECHNOLOGY
Inventor: Mingfeng LU , Tianshan ZHANG , Peihang LI , Chenchen JI , Jinmin WU , Yao HU , Weidong HU , Feng ZHANG , Ran TAO
CPC classification number: G01M11/30 , G06T7/60 , G06T2207/20081 , G06T2207/20084 , G06T2207/20132
Abstract: The present application relates to an interferogram phase estimation method. The interferogram phase estimation method includes: obtaining an interferogram for estimation of a measured object; and inputting the interferogram for estimation to a neural network model trained based on a method for training a neural network model for interferogram phase estimation, to obtain a phase image corresponding to the interferogram for estimation. In the interferogram phase estimation method of the present application, features of different scales of an interferogram are learned based on a Unet++ neural network model to obtain an accurately estimated phase image corresponding to the interferogram.