公开(公告)号：US20240255792A1

公开(公告)日：2024-08-01

申请号：US18629773

申请日：2024-04-08

Applicant: BOE Technology Group Co., Ltd.

Inventor： Huili WU ,  Wei HE ,  Jianjun ZHAO ,  Wenqing XUE ,  Renquan GU ,  Shipei LI ,  Dajun WANG ,  Shi SHU ,  Yong YU ,  Qi YAO ,  Yun QIU ,  Guangcai YUAN ,  Xue DONG

IPC: G02F1/1335 ,  G02B5/18

CPC classification number: G02F1/133504 ,  G02B5/1866 ,  G02F1/133512 ,  G02F1/133514

Abstract: A display substrate, a method of manufacturing the display substrate, a display panel, and a display device are provided. The display panel includes: an array substrate and an opposite substrate disposed opposite to each other; a liquid crystal layer between the array substrate and the opposite substrate; a first support component on a side of the array substrate facing the liquid crystal layer; and a second support component on a side of the opposite substrate facing the liquid crystal layer. An end portion of a side of the first support component facing away from the array substrate is contacted with an end portion of a side of the second support component facing away from the opposite substrate, and a contact surface has a concave-convex structure.

公开(公告)号：US20250113682A1

公开(公告)日：2025-04-03

申请号：US18292588

申请日：2022-11-02

Applicant: BOE TECHNOLOGY GROUP CO., LTD.

Inventor： Chengfei WANG ,  Junwei YAN ,  Zhonglin CHEN ,  Ren ZHOU ,  Jinxin AN ,  Ze REN ,  Guanghui PEI ,  Dajun WANG

IPC: H10H29/03 ,  H01L21/66 ,  H01L21/68 ,  H01L25/075

Abstract: A multi-coordinate system calibration and equipment alignment method includes: determining a first mapping relationship between a first image pixel coordinate system of an intermediate carrier substrate carrying stage and a world coordinate system; determining a second mapping relationship between a second image pixel coordinate system of a backplane carrying stage and the world coordinate system; determining galvanometer start point coordinates in the world coordinate system; obtaining first template calibration coordinates in the world coordinate system by using the first mapping relationship and the galvanometer start point coordinates; obtaining second template calibration coordinates in the world coordinate system by using the second mapping relationship and the galvanometer start point coordinates; aligning the intermediate carrier substrate based on actual coordinates of the intermediate carrier substrate carrying stage and the first template calibration coordinates; and aligning the backplane based on actual coordinates of the backplane carrying stage and the second template calibration coordinates.