公开(公告)号：US20220113710A1

公开(公告)日：2022-04-14

申请号：US17273177

申请日：2019-11-29

Applicant: BOE Technology Group Co., Ltd.

Inventor： Guoliang SHEN ,  Dong CHAI ,  Haohan WU ,  Tian LAN ,  Weihe LIU

IPC: G05B19/418

Abstract: A system for recommending a maximum quantity of work in process, in which one or more processors of a distributed storage device are configured to execute: acquiring at least part of production data stored in the distributed storage device, the production data includes quantity records and cycle time records of a production line in time periods, and the cycle time record of each time period includes a cycle time at each process station of the production line in said each time period; clustering the quantity records to obtain a plurality of initial classifications, each initial classification includes at least one quantity record; determining a portion of the initial classifications as preferred classifications; determining the maximum quantity of work in process at each process station; and a display device is configured to display the maximum quantity of work in process at each process station determined by an analysis device.

公开(公告)号：US20210364999A1

公开(公告)日：2021-11-25

申请号：US16972402

申请日：2019-11-29

Applicant: BOE TECHNOLOGY GROUP CO., LTD.

Inventor： Tian LAN ,  Hong WANG ,  Dong CHAI ,  Haohan WU ,  Guoliang SHEN ,  Weihe LIU

IPC: G05B19/406 ,  G06F3/147 ,  G06N20/00

Abstract: A system for analyzing cause of product defect, including: a distributed storage device configured to store production data generated by a factory device; an analysis device including one or more processors configured to perform: acquiring a production record from the production data; the production record includes information of processing devices used during production procedures for producing the products and information of defects occurring, where each product is processed by multiple processing devices, and each processing device participates in only the production procedures of a portion of the products; determining a correlation weight of the processing device to be analyzed corresponding to a defect to be analyzed according to the production record, and determining a correlation between the processing device to be analyzed and the defect to be analyzed according to the correlation weight; a display device configured to display an analysis result of the analysis device.

公开(公告)号：US20220317644A1

公开(公告)日：2022-10-06

申请号：US17431790

申请日：2020-02-28

Applicant: BOE TECHNOLOGY GROUP CO., LTD.

Inventor： Weihe LIU ,  Dong CHAI ,  Haohan WU ,  Guoliang SHEN ,  Tian LAN

IPC: G05B19/042

Abstract: The present disclosure provides a production programming system based on a nonlinear program model, including: a distributed storage device and an analysis device, wherein the analysis device includes a processor configured to obtain production record information; construct the nonlinear program model based on the production record information; and solve the nonlinear program model to obtain first feasible solutions. The nonlinear program model includes a constraint condition that satisfies process requirements and an objective function indicating pressure equilibrium across the same device set, and each of the first feasible solutions is configured to indicate a production program. The present disclosure further provides a production programming method and a computer-readable storage medium which can improve efficiency and reduce device idleness rate.

公开(公告)号：US20210133382A1

公开(公告)日：2021-05-06

申请号：US17030689

申请日：2020-09-24

Applicant: BOE Technology Group Co., Ltd.

Inventor： Qiang LI ,  Junxin ZHAO ,  Jie LI ,  Hong WANG ,  Suo ZHANG ,  Dong CHAI ,  Haohan WU ,  Xuefeng KAN ,  Fei YUAN

IPC: G06F30/392 ,  G06F30/31 ,  G06F9/54

Abstract: The present disclosure provides an electronic device, a method for generating a package drawing, and a computer readable storage medium. The electronic device includes a display device and a processor, the processor is configured to obtain a type of the element and size parameters corresponding to the element input by a user; determine a size and a position of each of pads corresponding to the element according to the type of the element and the size parameters corresponding to the element, and draw the pads; determine coordinates of endpoints of an entity layer corresponding to the element, and draw the entity layer; determine coordinates of endpoints of a height layer corresponding to the element, and draw the height layer; and determine coordinates of endpoints of a screen layer corresponding to the element, and draw the screen layer.