公开(公告)号：US20220113710A1

公开(公告)日：2022-04-14

申请号：US17273177

申请日：2019-11-29

Applicant: BOE Technology Group Co., Ltd.

Inventor： Guoliang SHEN ,  Dong CHAI ,  Haohan WU ,  Tian LAN ,  Weihe LIU

IPC: G05B19/418

Abstract: A system for recommending a maximum quantity of work in process, in which one or more processors of a distributed storage device are configured to execute: acquiring at least part of production data stored in the distributed storage device, the production data includes quantity records and cycle time records of a production line in time periods, and the cycle time record of each time period includes a cycle time at each process station of the production line in said each time period; clustering the quantity records to obtain a plurality of initial classifications, each initial classification includes at least one quantity record; determining a portion of the initial classifications as preferred classifications; determining the maximum quantity of work in process at each process station; and a display device is configured to display the maximum quantity of work in process at each process station determined by an analysis device.

公开(公告)号：US20210364999A1

公开(公告)日：2021-11-25

申请号：US16972402

申请日：2019-11-29

Applicant: BOE TECHNOLOGY GROUP CO., LTD.

Inventor： Tian LAN ,  Hong WANG ,  Dong CHAI ,  Haohan WU ,  Guoliang SHEN ,  Weihe LIU

IPC: G05B19/406 ,  G06F3/147 ,  G06N20/00

Abstract: A system for analyzing cause of product defect, including: a distributed storage device configured to store production data generated by a factory device; an analysis device including one or more processors configured to perform: acquiring a production record from the production data; the production record includes information of processing devices used during production procedures for producing the products and information of defects occurring, where each product is processed by multiple processing devices, and each processing device participates in only the production procedures of a portion of the products; determining a correlation weight of the processing device to be analyzed corresponding to a defect to be analyzed according to the production record, and determining a correlation between the processing device to be analyzed and the defect to be analyzed according to the correlation weight; a display device configured to display an analysis result of the analysis device.

公开(公告)号：US20240094141A1

公开(公告)日：2024-03-21

申请号：US17765595

申请日：2021-04-30

Applicant: Beijing Zhongxiangying Technology Co., Ltd. ,  BOE Technology Group Co., Ltd.

Inventor： Haijin WANG ,  Chuan WANG ,  Tian LAN ,  Jianmin WU ,  Yu FENG ,  Hong WANG ,  Yu WANG ,  Fan ZHANG ,  Jiawei REN ,  Jing XUE ,  Jianfeng ZENG

IPC: G01N21/95

CPC classification number: G01N21/95 ,  G01N2021/9511

Abstract: The present disclosure provides a method for processing defect information of a product, which includes the following steps of: acquiring defect information on a current film layer and defect information on historical film layers; determining whether defect information exists at a target location of the historical film layer if defect information exists at a target location of the current film layer; if defect information exists for a corresponding location to the target location in at least one of the historical film layers, deleting the defect information detected at the target location in the current film layer; and if no defect information exists for the target location in any of the historical film layers, retaining the defect information detected at the target location in the current film layer. According to this, for the defect information on the current film layer, only the defect information caused by factors of the current film layer may be retained, and the defect information caused by the historical film layers will not be retained, and thus, on the one hand, the stored data volume may be reduced, and on the other hand, the complexity of subsequent analysis of defect information may be simplified.

公开(公告)号：US20220317644A1

公开(公告)日：2022-10-06

申请号：US17431790

申请日：2020-02-28

Applicant: BOE TECHNOLOGY GROUP CO., LTD.

Inventor： Weihe LIU ,  Dong CHAI ,  Haohan WU ,  Guoliang SHEN ,  Tian LAN

IPC: G05B19/042

Abstract: The present disclosure provides a production programming system based on a nonlinear program model, including: a distributed storage device and an analysis device, wherein the analysis device includes a processor configured to obtain production record information; construct the nonlinear program model based on the production record information; and solve the nonlinear program model to obtain first feasible solutions. The nonlinear program model includes a constraint condition that satisfies process requirements and an objective function indicating pressure equilibrium across the same device set, and each of the first feasible solutions is configured to indicate a production program. The present disclosure further provides a production programming method and a computer-readable storage medium which can improve efficiency and reduce device idleness rate.