公开(公告)号：US20160247429A1

公开(公告)日：2016-08-25

申请号：US14435766

申请日：2014-09-29

Applicant: BOE TECHNOLOGY GROUP CO., LTD.

Inventor： Yanzhao LI ,  Gang WANG ,  Jingang FANG ,  Hui ZHAO ,  Qijun ZHA

IPC: G09G3/00

CPC classification number: G09G3/006 ,  G01J5/0066 ,  G01J2001/4247 ,  G01J2005/0081 ,  G09G3/32 ,  G09G2320/0295 ,  G09G2330/10 ,  G09G2360/147 ,  H01L51/0031

Abstract: The present disclosure provides a method and a system for testing an OLED display device. The method includes steps of: applying a testing signal to the to-be-tested OLED display device; acquiring a measured distribution image for a testing region of the OLED display device to which the testing signal is applied; comparing the measured distribution image with a corresponding calibrated distribution image so as to obtain a comparison result; determining whether or not there is a back plate abnormal point at the testing region in accordance with the comparison result; and when the comparison result indicates that there is a back plate abnormal point at the testing region, determining a position of the back plate abnormal point on the OLED display device.

Abstract translation: 本公开提供了一种用于测试OLED显示装置的方法和系统。 该方法包括以下步骤：将测试信号施加到被测试的OLED显示设备; 获取测试信号被应用于所述OLED显示装置的测试区域的测量分布图像; 将测量的分布图像与相应的校准分布图像进行比较，以获得比较结果; 根据比较结果确定测试区域是否有背板异常点; 并且当比较结果表示在测试区域存在背板异常点时，确定OLED显示装置上背板异常点的位置。