公开(公告)号：US20250157023A1

公开(公告)日：2025-05-15

申请号：US19023560

申请日：2025-01-16

Applicant: Bruker Technologies Ltd.

Inventor： Alexander Krokhmal ,  Alexander Brandt ,  Dor Perry ,  Asher Peled ,  Matthew Wormington

IPC: G06T7/00

Abstract: A system for X-ray measurement includes first and second X-ray measurement channels, each including X-ray source configured to apply an X-ray beam to a respective measurement site on a sample and an X-ray detector assembly (XDA) configured to sense X-ray emission from the respective measurement site. An imaging assembly is configured to capture an image of the sample. A processor is configured to align the first and second X-ray measurement channels with respective first and second measurement sites using the captured image.

公开(公告)号：US12249059B2

公开(公告)日：2025-03-11

申请号：US17709451

申请日：2022-03-31

Applicant: BRUKER TECHNOLOGIES LTD.

Inventor： Alexander Krokhmal ,  Alexander Brandt ,  Dor Perry ,  Asher Peled ,  Matthew Wormington

IPC: G06T7/00

Abstract: A system includes first and second imaging assemblies, and a processor. The first imaging assembly is configured to produce a first image of a measurement site in a sample. The second imaging assembly is coupled with a measurement assembly and is configured to produce a second image of the measurement site. The processor is configured to: (i) perform, based on the first image, a first movement of the sample relative to the measurement assembly, (ii) perform, based on the second image, a second movement of the sample for aligning the sample with the measurement assembly, and (iii) control the measurement assembly to perform a measurement in the measurement site.

公开(公告)号：US20230316487A1

公开(公告)日：2023-10-05

申请号：US17709451

申请日：2022-03-31

Applicant: BRUKER TECHNOLOGIES LTD.

Inventor： Alexander Krokhmal ,  Alexander Brandt ,  Dor Perry ,  Asher Peled ,  Matthew Wormington

IPC: G06T7/00

CPC classification number: G06T7/0004 ,  G06T2207/10116 ,  G06T2207/30148

Abstract: A system includes first and second imaging assemblies, and a processor. The first imaging assembly is configured to produce a first image of a measurement site in a sample. The second imaging assembly is coupled with a measurement assembly and is configured to produce a second image of the measurement site. The processor is configured to: (i) perform, based on the first image, a first movement of the sample relative to the measurement assembly, (ii) perform, based on the second image, a second movement of the sample for aligning the sample with the measurement assembly, and (iii) control the measurement assembly to perform a measurement in the measurement site.