公开(公告)号：US20250157023A1

公开(公告)日：2025-05-15

申请号：US19023560

申请日：2025-01-16

Applicant: Bruker Technologies Ltd.

Inventor： Alexander Krokhmal ,  Alexander Brandt ,  Dor Perry ,  Asher Peled ,  Matthew Wormington

IPC: G06T7/00

Abstract: A system for X-ray measurement includes first and second X-ray measurement channels, each including X-ray source configured to apply an X-ray beam to a respective measurement site on a sample and an X-ray detector assembly (XDA) configured to sense X-ray emission from the respective measurement site. An imaging assembly is configured to capture an image of the sample. A processor is configured to align the first and second X-ray measurement channels with respective first and second measurement sites using the captured image.

公开(公告)号：US12078604B2

公开(公告)日：2024-09-03

申请号：US17902926

申请日：2022-09-05

Applicant: BRUKER TECHNOLOGIES LTD.

Inventor： Alexander Krokhmal ,  Asher Peled

IPC: G01N23/223

CPC classification number: G01N23/223 ,  G01N2223/076 ,  G01N2223/3032 ,  G01N2223/3037 ,  G01N2223/306 ,  G01N2223/321 ,  G01N2223/6116

Abstract: A system for X-ray analysis, includes: (a) an X-ray analysis assembly configured to (i) direct an X-ray beam to impinge on a surface of a sample, and (ii) receive fluorescence radiation excited from the sample in response to the impinged X-ray beam, (b) a target assembly including measurement targets: placed in an optical path between the X-ray analysis assembly and the sample, and configured to move between (i) one or more first positions in which one or more of the measurement targets are positioned in the X-ray beam, and (ii) one or more second positions in which the optical path is unobstructed by the target assembly, and (c) a processor, configured to control movement of the target assembly between the first and second positions, for alternately, (i) monitoring properties of the X-ray beam using the measurement targets, and (ii) performing the X-ray analysis at a measurement site of the sample.

公开(公告)号：US20240077437A1

公开(公告)日：2024-03-07

申请号：US17902926

申请日：2022-09-05

Applicant: BRUKER TECHNOLOGIES LTD.

Inventor： Alexander Krokhmal ,  Asher Peled

IPC: G01N23/223

CPC classification number: G01N23/223 ,  G01N2223/076 ,  G01N2223/3306 ,  G01N2223/507

Abstract: A system for X-ray analysis, includes: (a) an X-ray analysis assembly configured to (i) direct an X-ray beam to impinge on a surface of a sample, and (ii) receive fluorescence radiation excited from the sample in response to the impinged X-ray beam, (b) a target assembly including measurement targets: placed in an optical path between the X-ray analysis assembly and the sample, and configured to move between (i) one or more first positions in which one or more of the measurement targets are positioned in the X-ray beam, and (ii) one or more second positions in which the optical path is unobstructed by the target assembly, and (c) a processor, configured to control movement of the target assembly between the first and second positions, for alternately, (i) monitoring properties of the X-ray beam using the measurement targets, and (ii) performing the X-ray analysis at a measurement site of the sample.

公开(公告)号：US12249059B2

公开(公告)日：2025-03-11

申请号：US17709451

申请日：2022-03-31

Applicant: BRUKER TECHNOLOGIES LTD.

Inventor： Alexander Krokhmal ,  Alexander Brandt ,  Dor Perry ,  Asher Peled ,  Matthew Wormington

IPC: G06T7/00

Abstract: A system includes first and second imaging assemblies, and a processor. The first imaging assembly is configured to produce a first image of a measurement site in a sample. The second imaging assembly is coupled with a measurement assembly and is configured to produce a second image of the measurement site. The processor is configured to: (i) perform, based on the first image, a first movement of the sample relative to the measurement assembly, (ii) perform, based on the second image, a second movement of the sample for aligning the sample with the measurement assembly, and (iii) control the measurement assembly to perform a measurement in the measurement site.

公开(公告)号：US20230316487A1

公开(公告)日：2023-10-05

申请号：US17709451

申请日：2022-03-31

Applicant: BRUKER TECHNOLOGIES LTD.

Inventor： Alexander Krokhmal ,  Alexander Brandt ,  Dor Perry ,  Asher Peled ,  Matthew Wormington

IPC: G06T7/00

CPC classification number: G06T7/0004 ,  G06T2207/10116 ,  G06T2207/30148

Abstract: A system includes first and second imaging assemblies, and a processor. The first imaging assembly is configured to produce a first image of a measurement site in a sample. The second imaging assembly is coupled with a measurement assembly and is configured to produce a second image of the measurement site. The processor is configured to: (i) perform, based on the first image, a first movement of the sample relative to the measurement assembly, (ii) perform, based on the second image, a second movement of the sample for aligning the sample with the measurement assembly, and (iii) control the measurement assembly to perform a measurement in the measurement site.