DISPLAY SUBSTRATE AND METHOD FOR TESTING THE SAME, DISPLAY APPARATUS

    公开(公告)号:US20170205956A1

    公开(公告)日:2017-07-20

    申请号:US15324796

    申请日:2016-03-25

    摘要: Embodiments of the invention provide display substrate, method for testing the same and display apparatus. The display substrate includes pixel regions arranged in matrix and test unit, each pixel region being provided with first electrode, wherein the test unit includes at least two test sub-units; first electrodes provided in adjacent pixel regions correspond to electrode block, and electrode blocks are electrically isolated from each other and divided, in accordance with their positions, into at least two test groups whose number is the same as that of the test sub-units; the electrode blocks of a same test group are provided spaced apart from each other in both row and column directions, and all the electrode blocks in the same test group are connected to one test sub-unit. The test unit can accurately test open or short defect existing in the display substrate, thereby improving test accuracy and lowering production costs.

    SHIFT REGISTER AND DRIVING METHOD THEREOF, GATE DRIVING CIRCUIT AND DISPLAY APPARATUS

    公开(公告)号:US20210225250A1

    公开(公告)日:2021-07-22

    申请号:US16304952

    申请日:2018-02-08

    IPC分类号: G09G3/20

    摘要: There are provided in the present disclosure a shift register and a driving method thereof, a gate driving circuit and a display apparatus. The shift register of the present disclosure includes: a forward scanning input sub-circuit for pre-charging a potential of a pull-up node by an operation level signal under control of a forward input signal and a forward scanning signal upon scanning forwards; a backward scanning input sub-circuit for pre-charging the potential of the pull-up node by an operation level signal under control of a backward input signal and a backward scanning signal upon scanning backwards; an output sub-circuit for outputting a clock signal through a signal output terminal under control of the potential of the pull-up node; wherein the pull-up node is a connection node of the forward scanning input sub-circuit, the backward scanning input sub-circuit and the output sub-circuit.