公开(公告)号：US08457919B2

公开(公告)日：2013-06-04

申请号：US12750846

申请日：2010-03-31

申请人： Benoit Feix ,  Georges Gagnerot ,  Mylene Roussellet ,  Vincent Verneuil

发明人： Benoit Feix ,  Georges Gagnerot ,  Mylene Roussellet ,  Vincent Verneuil

IPC分类号： G01R27/28

CPC分类号： G06F21/556 ,  G06F7/723 ,  G06F21/75 ,  G06F2207/7219 ,  G09C1/00 ,  H04L9/003 ,  H04L9/005 ,  H04L9/302

摘要： A process for testing an integrated circuit includes collecting a set of points of a physical property while the integrated circuit is executing a multiplication, dividing the set of points into a plurality subsets of lateral points, calculating an estimation of the value of the physical property for each subset, and applying to the subset of lateral points a step of horizontal transversal statistical processing by using the estimations of the value of the physical property, to verify a hypothesis about the variables manipulated by the integrated circuit.

摘要翻译： 一种用于测试集成电路的过程包括在集成电路正在执行乘法时收集物理特性的一组点，将该点集合划分成多个侧向点子集，计算物理属性值的估计 并且通过使用物理属性的值的估计来应用横向点的横向横向统计处理的步骤，以验证关于由集成电路操纵的变量的假设。