公开(公告)号：US3975828A

公开(公告)日：1976-08-24

申请号：US539372

申请日：1975-01-08

申请人： Bernard Jacob Calcaterra ,  Harold Edward Ogg, Jr. ,  James Herschell Osborne

发明人： Bernard Jacob Calcaterra ,  Harold Edward Ogg, Jr. ,  James Herschell Osborne

IPC分类号： G01B3/40 ,  G01B5/14 ,  G01B3/18 ,  G01B5/00

CPC分类号： G01B3/40 ,  G01B5/14

摘要： The invention relates to an adjustable master setting gauge. The gauge comprises a frame including a generally flat portion. A bar is mounted generally parallel to the flat portion, the bar comprising a portion of a height gauge fixture, one end of the bar being slidably supported within a base, and the other end of the bar being telescopically attached to a micrometer head. A bracket extends from the frame, the bracket including a first gauging surface laterally removed from the bar. The adjustable master setting gauge further includes a gauge mounting member detactably attachable to the bar and having an arm extending laterally from the bar. The arm includes a second gauging surface and the first and second gauging surfaces are laterally removed generally an equal distance from the bar. Thus, the distance between the first gauging surface and the second gauging surface can be adjusted by rotation of the micrometer head. This allows calibration of snap gauges from the first gauging surface to the second gauging surface.

摘要翻译： 本发明涉及一种可调整的主设定量规。 该计量器包括一个包括大致平坦部分的框架。 杆通常平行于平坦部分安装，杆包括高度计固定件的一部分，杆的一端可滑动地支撑在基座内，并且杆的另一端可伸缩地附接到千分尺头部。 支架从框架延伸，支架包括从杆横向移除的第一测量表面。 可调整的主设定仪还包括可拆卸地附接到杆并具有从杆横向延伸的臂的量规安装构件。 臂包括第二测量表面，并且第一和第二测量表面通常与杆大致相等的距离被横向移除。 因此，第一测量表面和第二测量表面之间的距离可以通过测微头的旋转来调节。 这允许从第一测量表面到第二测量表面校准捕捉量规。