公开(公告)号：US20110077882A1

公开(公告)日：2011-03-31

申请号：US12568985

申请日：2009-09-29

申请人： Bhavna Agrawal ,  David J. Hathaway ,  Pravin P. Kamdar ,  Karl K. Moody, III ,  Peng Peng ,  David W. Winston

发明人： Bhavna Agrawal ,  David J. Hathaway ,  Pravin P. Kamdar ,  Karl K. Moody, III ,  Peng Peng ,  David W. Winston

IPC分类号： G06F19/00 ,  G01R27/00

CPC分类号： G06F17/5022

摘要： Disclosed are embodiments of a system and of an associated method for estimating the leakage current of an electronic circuit. The embodiments analyze a layout of an electronic circuit in order to identify all driven and non-driven nets within the electronic circuit, to identify all of the driven net-bounded partitions within the electronic circuit (based on the driven and non-driven nets), and to identify, for each driven net-bounded partition, all possible states of the electronic circuit that can leak. Then, using this information, the embodiments estimate the leakage current of the electronic circuit. This is accomplished by first determining, for each state of each driven net-bounded partition, a leakage current of the driven net-bounded partition and a probability that the state will occur in the driven net-bounded partition during operation of the electronic circuit. Then, for each state of each driven net-bounded partition, the leakage current of the driven net-bounded partition and the state probability are multiplied together. The results are then aggregated.

摘要翻译： 公开了用于估计电子电路的漏电流的系统和相关方法的实施例。 实施例分析电子电路的布局，以便识别电子电路内的所有被驱动和非驱动的网络，以识别电子电路内的所有被驱动的网络边界的分区（基于被驱动和非驱动的网络） 并且为每个被驱动的有界分区识别可能泄漏的电子电路的所有可能的状态。 然后，使用该信息，实施例估计电子电路的漏电流。 这是通过首先确定每个受驱动网络边界分区的每个状态，驱动网络边界分区的泄漏电流以及在电子电路运行期间状态将在驱动网络划分区域内发生的概率来实现的。 然后，对于每个被驱动的有界分区的每个状态，驱动的有界分区的泄漏电流和状态概率相乘。 然后汇总结果。

公开(公告)号：US08239794B2

公开(公告)日：2012-08-07

申请号：US12568985

申请日：2009-09-29

申请人： Bhavna Agrawal ,  David J. Hathaway ,  Pravin P. Kamdar ,  Karl K. Moody, III ,  Peng Peng ,  David W. Winston

发明人： Bhavna Agrawal ,  David J. Hathaway ,  Pravin P. Kamdar ,  Karl K. Moody, III ,  Peng Peng ,  David W. Winston

IPC分类号： G06F17/50 ,  G06F17/10

CPC分类号： G06F17/5022

摘要： Disclosed are embodiments of a system and of an associated method for estimating the leakage current of an electronic circuit. The embodiments analyze a layout of an electronic circuit in order to identify all driven and non-driven nets within the electronic circuit, to identify all of the driven net-bounded partitions within the electronic circuit (based on the driven and non-driven nets), and to identify, for each driven net-bounded partition, all possible states of the electronic circuit that can leak. Then, using this information, the embodiments estimate the leakage current of the electronic circuit. This is accomplished by first determining, for each state of each driven net-bounded partition, a leakage current of the driven net-bounded partition and a probability that the state will occur in the driven net-bounded partition during operation of the electronic circuit. Then, for each state of each driven net-bounded partition, the leakage current of the driven net-bounded partition and the state probability are multiplied together. The results are then aggregated.

摘要翻译： 公开了用于估计电子电路的漏电流的系统和相关方法的实施例。 实施例分析电子电路的布局，以便识别电子电路内的所有被驱动和非驱动的网络，以识别电子电路内的所有被驱动的网络边界的分区（基于被驱动和非驱动的网络） 并且为每个被驱动的有界分区识别可能泄漏的电子电路的所有可能的状态。 然后，使用该信息，实施例估计电子电路的漏电流。 这是通过首先确定每个受驱动网络边界分区的每个状态的驱动网络边界分区的泄漏电流以及在电子电路运行期间该状态将在该被驱动的有界分区中发生的概率来实现的。 然后，对于每个被驱动的有界分区的每个状态，驱动的有界分区的泄漏电流和状态概率相乘。 然后汇总结果。

公开(公告)号：US06330354B1

公开(公告)日：2001-12-11

申请号：US08847011

申请日：1997-05-01

申请人： Pierre M. Companion ,  Karl K. Moody, III ,  Brenda M. Wilson

发明人： Pierre M. Companion ,  Karl K. Moody, III ,  Brenda M. Wilson

IPC分类号： G06K900

CPC分类号： G06T7/001 ,  G01N21/95607 ,  G01N21/95684 ,  G01N2021/8896 ,  G06T7/0002 ,  G06T2207/10056 ,  G06T2207/30148

摘要： A method for analyzing image data is disclosed that will find defects on a multi-layer device having solder pads, such as a semiconductor computer chip. The method provides a device template image, a theoretical image created from data from several real images, for comparison to an image of a device to be tested after the solder pad data is segmented. The parameter values of the device to be tested are recorded and compared to the parameter values of the device template, forming a difference image. The difference image and the solder pad data are then run through a series of tests, wherein the device is determined defective or not defective.

摘要翻译： 公开了一种用于分析图像数据的方法，其将在具有诸如半导体计算机芯片的焊盘的多层器件上发现缺陷。 该方法提供了设备模板图像，从几个实际图像的数据创建的理论图像，用于与在焊盘数据被分割之后要测试的设备的图像进行比较。 记录要测试的设备的参数值，并将其与设备模板的参数值进行比较，形成差分图像。 差分图像和焊盘数据然后通过一系列测试运行，其中该设备被确定为有缺陷或没有缺陷。