公开(公告)号：US20040104740A1

公开(公告)日：2004-06-03

申请号：US10440311

申请日：2003-05-19

Applicant: Broadcom Corporation

Inventor： Lawrence M. Burns ,  Leonard Dauphinee ,  Ramon A. Gomez ,  James Y.C. Chang

IPC: G01R031/02

CPC classification number: H01L22/20 ,  G01R31/2607 ,  G01R31/30 ,  G01R31/31723 ,  H03F3/211 ,  H04N5/4446 ,  H04N5/52 ,  H04N7/102

Abstract: A system or apparatus for monitoring an Integrated Circuit (IC) chip, comprises: a sense circuit at least partially constructed on the IC chip and configured to produce one or more sense signals each indicative of a corresponding process-dependent circuit parameter of the IC chip; and a digitizer module configured to produce, responsive to the one or more sense signals, one or more digitized signals each representative of a corresponding one of the sense signals. A controller is configured to determine a value of one or more of the process-dependent circuit parameters based on one or more of the digitized signals.

Abstract translation: 一种用于监视集成电路（IC）芯片的系统或装置，包括：感测电路，其至少部分地构造在所述IC芯片上并且被配置为产生一个或多个感测信号，每个感测信号指示所述IC芯片的相应的与处理有关的电路参数 ; 以及数字转换器模块，被配置为响应于所述一个或多个感测信号产生一个或多个数字化信号，每一个表示所述感测信号中相应的一个感测信号。 控制器被配置为基于一个或多个数字化信号来确定一个或多个处理相关电路参数的值。

公开(公告)号：US20040108866A1

公开(公告)日：2004-06-10

申请号：US10647472

申请日：2003-08-26

Applicant: Broadcom Corporation

Inventor： Lawrence M. Burns ,  Leonard Dauphinee ,  Ramon A. Gomez ,  James Y.C. Chang

IPC: G01R031/02

CPC classification number: H01L22/20 ,  G01R31/2607 ,  G01R31/30 ,  G01R31/31723 ,  H03F3/211 ,  H04N5/4446 ,  H04N5/52 ,  H04N7/102

Abstract: A system or apparatus for monitoring an Integrated Circuit (IC) chip includes: a sense circuit at least partially constructed on the IC chip and configured to produce one or more sense signals each indicative of a corresponding process-dependent circuit parameter of the IC chip; and a digitizer module configured to produce, responsive to the one or more sense signals, one or more digitized signals each representative of a corresponding one of the sense signals. A controller is configured to determine a value of one or more of the process-dependent circuit parameters based on one or more of the digitized signals.

Abstract translation: 用于监控集成电路（IC）芯片的系统或装置包括：感测电路，至少部分地构造在IC芯片上并被配置为产生一个或多个感测信号，每个感测信号指示IC芯片的相应的与处理有关的电路参数; 以及数字转换器模块，被配置为响应于所述一个或多个感测信号产生一个或多个数字化信号，每一个表示所述感测信号中相应的一个感测信号。 控制器被配置为基于一个或多个数字化信号来确定一个或多个处理相关电路参数的值。