公开(公告)号：US20240271994A1

公开(公告)日：2024-08-15

申请号：US18569035

申请日：2022-06-11

Applicant: CAM2 TECHNOLOGIES, LLC

Inventor： Gregg Ressler ,  Jonathan A Frattaroli ,  David W Schiering ,  John A Seelenbinder ,  Kenneth C Schreiber ,  Mark Stoltze ,  James McWilliams ,  Anthony W DiDomenico

IPC: G01J1/02 ,  G01J3/02 ,  G01J3/453 ,  G01N21/35 ,  G01N21/3504

CPC classification number: G01J1/0233 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/027 ,  G01J3/453 ,  G01N21/3504 ,  G01N2021/3595 ,  G01N2201/0221

Abstract: A gas and vapor analyzer system and method of detecting a gas or vapor sample are provided. An FTIR spectroscopy system of an analyzer system comprises an interferometer adapted to modulate an excitation signal. A gas cell is adapted to receive the modulated excitation signal and focus the modulated excitation signal within the gas cell via an input lens. An off-axis multiple reflection geometry is adapted to receive the focused modulated excitation signal and pass the focused modulated excitation signal through a gas or vapor phase specimen via a plurality of beam paths skewed relative to a longitudinal axis of the cell to generate an optical sample signal. An exit lens is adapted to direct the optical sample signal from the gas cell to an IR radiation detector, and a controller is adapted to identify a detected gas and vapor sample based on the optical sample signal.