X-RAY DIAGNOSTIC APPARATUS AND X-RAY DIAGNOSTIC METHOD

    公开(公告)号:US20210353240A1

    公开(公告)日:2021-11-18

    申请号:US17319688

    申请日:2021-05-13

    Inventor: Daisuke SATO

    Abstract: According to one embodiment, an X-ray diagnostic apparatus includes processing circuitry. The processing circuitry is configured to control an X-ray tube to perform an X-ray irradiation, that is performed prior to an X-ray imaging performed on an object, based on an imaging condition where at least one of an X-ray irradiation range and dose is smaller than an imaging condition of the X-ray imaging. Further, the processing circuitry is configured to evaluate a positional relationship between the X-ray tube and an X-ray detector based on a detection result of an X-ray irradiated in the prior X-ray irradiation by the X-ray detector.

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