公开(公告)号：US20140184240A1

公开(公告)日：2014-07-03

申请号：US13731012

申请日：2012-12-30

申请人： CHING-TSUNG CHEN ,  WEICHUNG CHEN

发明人： CHING-TSUNG CHEN ,  WEICHUNG CHEN

IPC分类号： G01R1/20

CPC分类号： G01R31/2889 ,  G01R31/31926 ,  H01L2221/00 ,  H04B2203/00 ,  H04B2215/00

摘要： In this invention, a test system includes a tester and a switching module for connecting any pin to the tester for testing a device-under-test (DUT), the test system has a rectifying device between the ground of the DUT and the ground of the switching module in order to isolate the DUT from the switching module, thereby blocking unwanted current flowing between the DUT and the switching module to ensure the correctness of the testing.Since the ground of the switching module is not directly connected to the ground of the DUT and the tester, the rectifying device will keep the voltage difference between the ground of the switching module and the DUT in a range between zero and the cut-in voltage of the rectifying device, thereby allowing single-ended signals to be used between the switching module and the tester or the DUT.

摘要翻译： 在本发明中，测试系统包括测试器和用于将任何引脚连接到测试器以测试被测器件（DUT）的开关模块，该测试系统在DUT的接地和地面之间具有整流器件 开关模块，以便将DUT与开关模块隔离，从而阻止DUT和开关模块之间的不必要的电流流动，以确保测试的正确性。 由于开关模块的接地不直接连接到DUT和测试仪的接地端，因此整流装置将保持开关模块和DUT之间的电压差在零和切入电压之间的范围内 ，从而允许在开关模块和测试器或DUT之间使用单端信号。