Method and system for defect detection

    公开(公告)号:US11922617B2

    公开(公告)日:2024-03-05

    申请号:US18196900

    申请日:2023-05-12

    CPC classification number: G06T7/0006 G06T7/337 G06T2207/20084

    Abstract: The present application provides a method and system for defect detection. The method includes: acquiring a two-dimensional (2D) picture of an object to be detected; inputting the acquired 2D picture to a trained defect segmentation model to obtain a segmented 2D defect mask, where the defect segmentation model is trained based on a multi-level feature extraction instance segmentation network with intersection over union (IoU) thresholds being increased level by level, and the 2D defect mask includes information about a defect type, a defect size, and a defect location of a segmented defect region; and determining the segmented 2D defect mask based on a predefined defect rule to output a defect detection result.

    Image processing method
    2.
    发明授权

    公开(公告)号:US11823326B2

    公开(公告)日:2023-11-21

    申请号:US18317067

    申请日:2023-05-13

    Abstract: An image processing method includes obtaining two-dimensional and three-dimensional images of an object, extracting luminance and depth information from the three-dimensional image to generate luminance and depth image for the object, graying the two-dimensional image to obtain a single-channel grayscale image, selecting at least three same-location points from each of the grayscale and luminance image, calculating a coordinate transformation matrix between the grayscale and luminance images based on coordinates of the at least three same-location points in each of the grayscale and luminance images, and aligning the two-dimensional image with the luminance and depth images based on the coordinate transformation matrix to obtain fused image data. The fused image data includes color information of the two-dimensional image and the luminance and depth information of the three-dimensional image.

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