TEST METHOD AND SYSTEM FOR CUT-IN VOLTAGE
    1.
    发明申请
    TEST METHOD AND SYSTEM FOR CUT-IN VOLTAGE 有权
    用于切入电压的测试方法和系统

    公开(公告)号:US20150338455A1

    公开(公告)日:2015-11-26

    申请号:US14759370

    申请日:2013-12-31

    CPC classification number: G01R31/2621 G01R31/2623

    Abstract: A test method and system for cut-in voltage. The method comprises: coarse scanning of the cut-in voltage: a grid voltage, i.e., the cut-in voltage, is quickly determined when a drain terminal current is greater than a target current for the first time (100); accurate scanning of the cut-in voltage: a scanning step length is shortened continuously until the scanning step length is shorter than a preset step length, and each time the scanning step length is shortened, the scanning is conducted according to the current shortened scanning step length on the basis of the cut-in voltage determined in the former time, and then the cut-in voltage under the condition of the current shortened scanning step length is determined again (200). The scanning voltage is automatically increased or decreased by the test method and system through adding high resolution and high precision test conversion into a second scanning test, and therefore the testing of the cut-in voltage becomes more efficient and more accurate.

    Abstract translation: 一种插入电压的测试方法和系统。 该方法包括:当第一次(100)漏极端电流大于目标电流时,快速确定切入电压的粗扫描:电网电压即插入电压; 切入电压的准确扫描:扫描步长连续缩短直到扫描步长短于预设步长,并且每当扫描步长缩短时,根据当前缩短的扫描步骤进行扫描 根据先前确定的切入电压的长度,然后再次确定在当前缩短扫描步长的条件下的切入电压(200)。 通过将高分辨率和高精度的测试转换添加到第二扫描测试中,通过测试方法和系统自动地增加或减少扫描电压,因此切入电压的测试变得更有效和更准确。

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