Methods, systems, and articles of manufacture for trace warping for electronic designs

    公开(公告)号:US09659142B1

    公开(公告)日:2017-05-23

    申请号:US14876141

    申请日:2015-10-06

    CPC classification number: G06F17/5022

    Abstract: Disclosed are techniques for implementing trace warping for electronic designs. These techniques identify a portion of an electronic design including a set of signals of interest corresponding to a plurality of simulation combinations over a range of clock cycles in a trace display. A pair of matching simulation combinations is identified from one or more pairs of matching simulation combinations for the set of signals of interest; and a first clock cycle and a second clock cycle corresponding to the pair of matching simulation combinations are identified in the range of clock cycles. A plurality of clock cycles between the first clock cycle and the second clock cycle can be compressed in the trace display.

    System, method, and computer program product for displaying debugging during a formal verification

    公开(公告)号:US10783304B1

    公开(公告)日:2020-09-22

    申请号:US16145535

    申请日:2018-09-28

    Abstract: The present disclosure relates to a method for electronic design. Embodiments may include displaying, at a graphical user interface, at least a portion of a cover trace or an assertion counter-example associated with an electronic design. Embodiments may also include allowing, at the graphical user interface, a user to analyze the cover trace or the assertion counter-example during a debugging session. Embodiments may further include identifying a dead-end state during the analysis and converting one or more constraints used in the debugging session to soft constraints. Embodiments may further include identifying at least one trace, based upon, at least in part, the soft constraints and displaying at least one unsatisfied constraint associated with the identified trace at the graphical user interface.

    Methods, systems, and articles of manufacture for X-behavior verification of an electronic design

    公开(公告)号:US10380295B1

    公开(公告)日:2019-08-13

    申请号:US15087725

    申请日:2016-03-31

    Abstract: Disclosed are techniques for verifying X-behavior in electronic designs. These techniques identify at least a portion of an electronic design, wherein the at least the portion that includes an input node, an output node, and an internal node located between the input node and the output node. Internal X-propagation proof results may be generated for the internal node based in part or in whole upon an internal precondition and an internal harmless condition for the internal node. X-propagation verification for the output node may then be performed based in part upon one or more assumed properties at the internal node, wherein the one or more assumed properties are assumed at the internal node based in part or in whole upon the internal X-propagation proof results.

    System, method, and computer program product for capture and reuse in a debug workspace

    公开(公告)号:US10331547B1

    公开(公告)日:2019-06-25

    申请号:US15602415

    申请日:2017-05-23

    Abstract: The present disclosure relates to a method for reusing a debugging workspace in an electronic design environment. Embodiments may include performing, using a processor, a verification of an electronic design and identifying at least one triggered property associated with the electronic design. Embodiments may further include identifying at least one fan-in signal associated with the at least one triggered property of the electronic design. Embodiments may also include determining a start point debug location based upon, at least in part, the at least one fan-in signal, wherein the start point debug location includes at least one of signal information, cycle information, and event time information. Embodiments may further include generating a debug workspace, wherein generating includes adding at least one additional debug location and storing a cycle of the additional debug location as a relative cycle that is relative to another debug location associated with the debug workspace.

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