公开(公告)号：US20040089816A1

公开(公告)日：2004-05-13

申请号：US10616896

申请日：2003-07-09

Applicant: California Institute of Technology

Inventor： Stephen R. Quake ,  Guillaume Lessard ,  Lawrence A. Wade ,  Jordan M. Gerton

IPC: G01N021/64

CPC classification number: G01Q60/20 ,  G01Q30/025 ,  G01Q30/04 ,  G01Q30/18 ,  G01Q40/00 ,  G01Q60/06 ,  G01Q70/12 ,  G02B21/16 ,  Y10S977/862

Abstract: Methods and systems for operating an apertureless microscope for observing one or more features to a molecular sensitivity on objects are described. More particularly, the method includes moving a tip of a probe coupled to a cantilever in a vicinity of a feature of a sample, which emits one or more photons at a detected rate relative to a background rate of the sample based upon the presence of the tip of the probe in the vicinity of the feature. The method modifies the detected rate of the feature of the sample, whereupon the modifying of the detected rate causes the feature of the sample to enhance relative to background rate of the feature.

Abstract translation: 描述了用于操作无孔显微镜以观察一个或多个特征以使物体上的分子灵敏度的方法和系统。 更具体地，该方法包括将耦合到悬臂的探针的尖端移动到样品特征附近，基于样品的存在以相对于样品的背景速率以检测的速率发射一个或多个光子 探头尖端附近的特征。 该方法修改检测到的样本特征的速率，因此修改检测到的速率导致样本的特征相对于特征的背景速率增强。