Optical microscope
    1.
    发明授权
    Optical microscope 有权
    光学显微镜

    公开(公告)号:US08217346B2

    公开(公告)日:2012-07-10

    申请号:US12995659

    申请日:2009-06-03

    IPC分类号: G01N23/22

    摘要: An optical microscope for optically measuring a sample (30) includes: a fluorescent thin membrane (13) which at least partly contains fluorescent substance and on which the sample (30) is placed; an electron source (11) for generating an electron beam; an electron lens (12) for focusing the electron beam generated by the electron source (11) in such a manner as to excite a minute light source having a wavelength shorter than a visible light wavelength from the fluorescent thin membrane (13) so as to irradiate the fluorescent thin membrane (13) with the electron beam, and further, scanning the focused electron beam; and an optical detector (22) for detecting a measurement light beam which is generated in the minute light source and acts on the sample (30).

    摘要翻译: 用于光学测量样品(30)的光学显微镜包括:荧光薄膜(13),其至少部分地含有荧光物质,并且所述样品(30)放置在所述荧光薄膜上; 用于产生电子束的电子源(11); 电子透镜(12),用于聚焦由电子源(11)产生的电子束,以便从荧光薄膜(13)激发具有比可见光波长短的波长的微小光源,以便 用电子束照射荧光薄膜(13),进一步扫描聚焦电子束; 以及用于检测在微小光源中产生并作用在样品(30)上的测量光束的光学检测器(22)。

    Microscopy imaging
    2.
    发明申请
    Microscopy imaging 有权
    显微镜成像

    公开(公告)号:US20110249109A1

    公开(公告)日:2011-10-13

    申请号:US13095175

    申请日:2011-04-27

    申请人: Alan Marc Fine

    发明人: Alan Marc Fine

    IPC分类号: H04N7/18

    摘要: Among other things, an imaging device has a photosensitive array of pixels, and a surface associated with the array is configured to receive a specimen with at least a part of the specimen at a distance from the surface equivalent to less than about half of an average width of the pixels.

    摘要翻译: 除其他之外,成像装置具有像素的光敏阵列,并且与阵列相关联的表面被配置为接收样本,其中至少一部分样本与表面的距离相当于小于平均值的大约一半 像素的宽度。

    PROBES FOR SCANNING PROBE MICROSCOPY
    3.
    发明申请
    PROBES FOR SCANNING PROBE MICROSCOPY 审中-公开
    扫描探针显微镜探针

    公开(公告)号:US20100032719A1

    公开(公告)日:2010-02-11

    申请号:US12248652

    申请日:2008-10-09

    IPC分类号: H01L21/20 H01L29/205

    CPC分类号: G01Q70/14 G01Q60/20

    摘要: Disclosed are probes for scanning probe microscopy comprising a semiconductor heterostructure and methods of making the probes. The semiconductor heterostructure determines the optical properties of the probe and allows for optical imaging with nanometer resolution.

    摘要翻译: 公开了用于扫描探针显微镜的探针,其包括半导体异质结构和制备探针的方法。 半导体异质结构确定探针的光学性质,并允许以纳米分辨率进行光学成像。

    Scanning near field optical microscope
    4.
    发明授权
    Scanning near field optical microscope 失效
    扫描近场光学显微镜

    公开(公告)号:US5894122A

    公开(公告)日:1999-04-13

    申请号:US815816

    申请日:1997-03-12

    申请人: Eisuke Tomita

    发明人: Eisuke Tomita

    摘要: A high resolution observation apparatus capable of resolving details smaller than the wavelength of a laser beam used for detection includes a probe for scattering evanescent light projected from a sample in response to the incident laser light. The scattered evanescent light is detected by a photodetector located proximate the probe tip. During measurements, the position of the probe is controlled in the Z axis by a fine movement mechanism while being scanned in the XY plane to conduct measurements. The distance between the probe and the sample is maintained constant by use of a Z-axis servo circuit responsive to an output signal of the photodetector for producing a control signal to control the fine movement mechanism to maintain the detected evanescent light constant. A three-dimensional display of an output of the servo circuit is provided.

    摘要翻译: 能够分辨小于用于检测的激光束的波长的细节的高分辨率观察装置,包括:用于响应于入射的激光散射从样本投射的ev逝光的探针。 散射的消逝光由位于探针尖端附近的光电检测器检测。 在测量过程中,探头的位置在XY平面扫描时通过微动机构在Z轴上进行控制,以进行测量。 通过使用响应于光电检测器的输出信号的Z轴伺服电路来产生控制信号来控制探头与样品之间的距离,以控制微动机构以保持检测到的ev逝光恒定。 提供伺服电路的输出的三维显示。

    DEVICE AND METHOD FOR THE EVANESCENT ILLUMINATION OF A SAMPLE
    5.
    发明申请
    DEVICE AND METHOD FOR THE EVANESCENT ILLUMINATION OF A SAMPLE 有权
    用于样品的历史照明的装置和方法

    公开(公告)号:US20110062348A1

    公开(公告)日:2011-03-17

    申请号:US12991108

    申请日:2009-04-28

    IPC分类号: G01N21/64

    摘要: A device for the evanescent illumination of a sample, including an optical illumination element with an optical corrective element and an objective arranged downstream from the corrective element, to evanescently illuminate the sample with a supplied ray beam containing optical radiation with at least two different wavelengths. The corrective optical element has a transverse chromatic aberration which, during the illumination, leads to the optical radiation penetrating the pupil of the objective at different heights relative to the optical axis varying according to the wavelength. The corrective optical element is selected in such a way that the wavelength-related difference of the penetration depths of the radiation into the sample is reduced during the evanescent illumination.

    摘要翻译: 一种用于样品的消逝照明的装置,包括具有光学校正元件的光学照明元件和布置在校正元件下游的物镜,以使包含具有至少两个不同波长的光学辐射的所提供的射线束ev逝照射样品。 校正光学元件具有横向色差,其在照明期间导致相对于根据波长变化的光轴的不同高度穿透物镜的光瞳的光学辐射。 选择校正光学元件,使得在渐逝照射期间辐射进入样品的穿透深度的波长相关差异减小。

    Single analyte molecule detection by fibre fluorescence probe
    6.
    发明授权
    Single analyte molecule detection by fibre fluorescence probe 失效
    通过纤维荧光探针检测单分析物

    公开(公告)号:US07657133B2

    公开(公告)日:2010-02-02

    申请号:US11573800

    申请日:2005-08-18

    IPC分类号: G02B6/00

    摘要: An apparatus for single analyte molecule detection includes: a light source (20) for generating excitation light; a dichroic mirror (22) disposed on a first path of excitation light generated by the light source, wherein the mirror directs excitation light into a fiber aligner (30); an optical transducer coupled to the light source by the fiber aligner, the optical transducer comprising an optical waveguide (40) made of dielectric material having a first dielectrical index; a photon detector (70) disposed to receive fluorescent back radiation, wherein when a test solution having a second dielectric index lower than the first index is provided and comprises one or more target molecules, excitation light is transmitted by the waveguide and exits a waveguide tip disposed in the test solution so as to excite one or more target molecules; subsequently, the waveguide transmits back radiation along a second path to the photon detector that detects the transmitted back radiation.

    摘要翻译: 用于单一分析物分子检测的装置包括:用于产生激发光的光源(20); 分色镜(22),设置在由所述光源产生的激发光的第一路径上,其中所述反射镜将激发光引导到光纤对准器(30)中; 由光纤对准器耦合到光源的光学传感器,所述光学换能器包括由具有第一介电折射率的介电材料制成的光波导(40); 设置为接收荧光反射辐射的光子检测器(70),其中当提供具有低于第一指数的第二介电指数的测试溶液并且包括一个或多个靶分子时,激发光由波导传输并离开波导尖端 放置在测试溶液中以激发一个或多个靶分子; 随后,波导将沿着第二路径的反射辐射传输到检测传输的反射辐射的光子检测器。

    Apparatus and method for detecting deformability of cells using spatially modulated optical force microscopy
    7.
    发明授权
    Apparatus and method for detecting deformability of cells using spatially modulated optical force microscopy 失效
    使用空间调制光学力学显微镜检测细胞变形能力的装置和方法

    公开(公告)号:US07460240B2

    公开(公告)日:2008-12-02

    申请号:US11581516

    申请日:2006-10-17

    申请人: Osman Akcakir

    发明人: Osman Akcakir

    IPC分类号: G01B9/021

    摘要: The present invention utilizes spatially modulated optical force microscopy (SMOFM) with single beam optical force probing capability or with a holographic optical trapping system capable of multi-beam optical force probing coupled to a microscope objective, to generate a probe beam(s) as a force probe to perturb the object that is adhered or resting on a surface, so that deformations of the object may subsequently be quantified. This quantification is performed by imaging a sequence of four phase shifted replicas of the image using a computer-controlled spatial light modulator, and calculating the pixel by pixel optical path-length using existing algorithms. The change in optical path lengths, and consequently the viscoelastic or elastic response elicited, is an indication of damage or disease when the objects are cells. In another embodiment, the optical deformability of the cells may be measured and correlated with measurements of cytoskeletal/structural protein expression.

    摘要翻译: 本发明利用具有单光束光学力探测能力的空间调制光学力学显微镜(SMOFM)或利用能够与显微镜物镜耦合的多光束光学力探测的全息光学捕获系统来产生探测光束作为 力探测器扰乱粘附或搁置在表面上的物体,从而可以随后量化物体的变形。 通过使用计算机控制的空间光调制器对图像的四个相移复制品的序列进行成像,并使用现有算法计算逐像素光程长度来执行该量化。 光路长度的变化以及由此引起的粘弹性或弹性响应的变化是当物体是细胞时的损害或疾病的指示。 在另一个实施方案中,可以测量细胞的光学可变形性并与细胞骨架/结构蛋白表达的测量相关。

    Near-field intra-cellular apertureless microscope
    8.
    发明授权
    Near-field intra-cellular apertureless microscope 有权
    近场细胞内无孔显微镜

    公开(公告)号:US07116475B2

    公开(公告)日:2006-10-03

    申请号:US10463810

    申请日:2003-06-18

    IPC分类号: G02B21/06

    CPC分类号: G01Q60/20

    摘要: Sub-wavelength size fluorescent particles attach to specific gene sites or a magnetic bead that is maneuvered around a cell volume to produce evanescent fields when illuminated in the far-field from light outside the cell volume. Light scattering from the sub-wavelength particles produces near-field interactions with surrounding molecules. The sub-wavelength scattering particles may be metallic spheres. Using particles within the cell removes large far-field scattered light from the mechanical structure of a supporting probe. Near-field light is modulated with an oscillating magnetic field, and micro-positioning is accomplished by a computer controlled DC magnetic field to scan the particle around within the cell. The Near-Field Intra-Cellular Apertureless Microscope (NICAM) technique enables non-destructive sub-wavelength resolution imaging without inserting a near-field (illumination or collection mode) probe into a cell.

    摘要翻译: 亚波长尺寸的荧光颗粒附着到特定基因位点或磁珠周围,该磁珠围绕细胞体积进行操纵,以在远场照射细胞体外的光时产生ev逝场。 来自亚波长颗粒的光散射产生与周围分子的近场相互作用。 亚波长散射颗粒可以是金属球体。 使用细胞内的颗粒从支撑探针的机械结构去除大的远场散射光。 利用振荡磁场对近场光进行调制,通过计算机控制的DC磁场实现微定位,以扫描细胞周围的粒子。 近场细胞内无孔显微镜(NICAM)技术可在不将近场(照明或收集模式)探针插入细胞的情况下实现非破坏性亚波长分辨率成像。

    Near-field intra-cellular apertureless microscope

    公开(公告)号:US20060119934A1

    公开(公告)日:2006-06-08

    申请号:US10463810

    申请日:2003-06-18

    IPC分类号: G02B21/00

    CPC分类号: G01Q60/20

    摘要: Sub-wavelength size fluorescent particles attach to specific gene sites or a magnetic bead that is maneuvered around a cell volume to produce evanescent fields when illuminated in the far-field from light outside the cell volume. Light scattering from the sub-wavelength particles produces near-field interactions with surrounding molecules. The sub-wavelength scattering particles may be metallic spheres. Using particles within the cell removes large far-field scattered light from the mechanical structure of a supporting probe. Near-field light is modulated with an oscillating magnetic field, and micro-positioning is accomplished by a computer controlled DC magnetic field to scan the particle around within the cell. The Near-Field Intra-Cellular Apertureless Microscope (NICAM) technique enables non-destructive sub-wavelength resolution imaging without inserting a near-field (illumination or collection mode) probe into a cell.

    Conductive transparent probe and probe control apparatus

    公开(公告)号:US20050103994A1

    公开(公告)日:2005-05-19

    申请号:US11001038

    申请日:2004-12-02

    申请人: Toru Murashita

    发明人: Toru Murashita

    CPC分类号: G01Q60/20 Y10S977/86

    摘要: A conductive transparent probe used in a probe control apparatus for adjusting a distance between the apex of the probe and a sample by vibrating the probe with an vibrator in a direction perpendicular to the axis of the probe is provided. The conductive transparent probe includes: an optical fiber having a taper part at one end; a conductive transparent film formed on the surface of the taper part; a first metal film formed on the surface of the optical fiber other than the taper part; wherein the conductive transparent film and the first metal film are electrically connected, and length and thickness of the first metal film are determined such that the conductive transparent probe vibrates while contacting with the vibrator.