摘要:
An optical microscope for optically measuring a sample (30) includes: a fluorescent thin membrane (13) which at least partly contains fluorescent substance and on which the sample (30) is placed; an electron source (11) for generating an electron beam; an electron lens (12) for focusing the electron beam generated by the electron source (11) in such a manner as to excite a minute light source having a wavelength shorter than a visible light wavelength from the fluorescent thin membrane (13) so as to irradiate the fluorescent thin membrane (13) with the electron beam, and further, scanning the focused electron beam; and an optical detector (22) for detecting a measurement light beam which is generated in the minute light source and acts on the sample (30).
摘要:
Among other things, an imaging device has a photosensitive array of pixels, and a surface associated with the array is configured to receive a specimen with at least a part of the specimen at a distance from the surface equivalent to less than about half of an average width of the pixels.
摘要:
Disclosed are probes for scanning probe microscopy comprising a semiconductor heterostructure and methods of making the probes. The semiconductor heterostructure determines the optical properties of the probe and allows for optical imaging with nanometer resolution.
摘要:
A high resolution observation apparatus capable of resolving details smaller than the wavelength of a laser beam used for detection includes a probe for scattering evanescent light projected from a sample in response to the incident laser light. The scattered evanescent light is detected by a photodetector located proximate the probe tip. During measurements, the position of the probe is controlled in the Z axis by a fine movement mechanism while being scanned in the XY plane to conduct measurements. The distance between the probe and the sample is maintained constant by use of a Z-axis servo circuit responsive to an output signal of the photodetector for producing a control signal to control the fine movement mechanism to maintain the detected evanescent light constant. A three-dimensional display of an output of the servo circuit is provided.
摘要:
A device for the evanescent illumination of a sample, including an optical illumination element with an optical corrective element and an objective arranged downstream from the corrective element, to evanescently illuminate the sample with a supplied ray beam containing optical radiation with at least two different wavelengths. The corrective optical element has a transverse chromatic aberration which, during the illumination, leads to the optical radiation penetrating the pupil of the objective at different heights relative to the optical axis varying according to the wavelength. The corrective optical element is selected in such a way that the wavelength-related difference of the penetration depths of the radiation into the sample is reduced during the evanescent illumination.
摘要:
An apparatus for single analyte molecule detection includes: a light source (20) for generating excitation light; a dichroic mirror (22) disposed on a first path of excitation light generated by the light source, wherein the mirror directs excitation light into a fiber aligner (30); an optical transducer coupled to the light source by the fiber aligner, the optical transducer comprising an optical waveguide (40) made of dielectric material having a first dielectrical index; a photon detector (70) disposed to receive fluorescent back radiation, wherein when a test solution having a second dielectric index lower than the first index is provided and comprises one or more target molecules, excitation light is transmitted by the waveguide and exits a waveguide tip disposed in the test solution so as to excite one or more target molecules; subsequently, the waveguide transmits back radiation along a second path to the photon detector that detects the transmitted back radiation.
摘要:
The present invention utilizes spatially modulated optical force microscopy (SMOFM) with single beam optical force probing capability or with a holographic optical trapping system capable of multi-beam optical force probing coupled to a microscope objective, to generate a probe beam(s) as a force probe to perturb the object that is adhered or resting on a surface, so that deformations of the object may subsequently be quantified. This quantification is performed by imaging a sequence of four phase shifted replicas of the image using a computer-controlled spatial light modulator, and calculating the pixel by pixel optical path-length using existing algorithms. The change in optical path lengths, and consequently the viscoelastic or elastic response elicited, is an indication of damage or disease when the objects are cells. In another embodiment, the optical deformability of the cells may be measured and correlated with measurements of cytoskeletal/structural protein expression.
摘要:
Sub-wavelength size fluorescent particles attach to specific gene sites or a magnetic bead that is maneuvered around a cell volume to produce evanescent fields when illuminated in the far-field from light outside the cell volume. Light scattering from the sub-wavelength particles produces near-field interactions with surrounding molecules. The sub-wavelength scattering particles may be metallic spheres. Using particles within the cell removes large far-field scattered light from the mechanical structure of a supporting probe. Near-field light is modulated with an oscillating magnetic field, and micro-positioning is accomplished by a computer controlled DC magnetic field to scan the particle around within the cell. The Near-Field Intra-Cellular Apertureless Microscope (NICAM) technique enables non-destructive sub-wavelength resolution imaging without inserting a near-field (illumination or collection mode) probe into a cell.
摘要:
Sub-wavelength size fluorescent particles attach to specific gene sites or a magnetic bead that is maneuvered around a cell volume to produce evanescent fields when illuminated in the far-field from light outside the cell volume. Light scattering from the sub-wavelength particles produces near-field interactions with surrounding molecules. The sub-wavelength scattering particles may be metallic spheres. Using particles within the cell removes large far-field scattered light from the mechanical structure of a supporting probe. Near-field light is modulated with an oscillating magnetic field, and micro-positioning is accomplished by a computer controlled DC magnetic field to scan the particle around within the cell. The Near-Field Intra-Cellular Apertureless Microscope (NICAM) technique enables non-destructive sub-wavelength resolution imaging without inserting a near-field (illumination or collection mode) probe into a cell.
摘要:
A conductive transparent probe used in a probe control apparatus for adjusting a distance between the apex of the probe and a sample by vibrating the probe with an vibrator in a direction perpendicular to the axis of the probe is provided. The conductive transparent probe includes: an optical fiber having a taper part at one end; a conductive transparent film formed on the surface of the taper part; a first metal film formed on the surface of the optical fiber other than the taper part; wherein the conductive transparent film and the first metal film are electrically connected, and length and thickness of the first metal film are determined such that the conductive transparent probe vibrates while contacting with the vibrator.