公开(公告)号：US06392846B1

公开(公告)日：2002-05-21

申请号：US08762753

申请日：1996-12-10

申请人： Charles Allen Brown ,  Heidi Lee Merkins ,  Robert Carl Reinhart ,  Ronald Lee Weaver ,  Herman Russell Wendt ,  Susan G. Scanlon

发明人： Charles Allen Brown ,  Heidi Lee Merkins ,  Robert Carl Reinhart ,  Ronald Lee Weaver ,  Herman Russell Wendt ,  Susan G. Scanlon

IPC分类号： G11B555

CPC分类号： G11B5/5526

摘要： A coil assembly for disk drive components is presented which includes a coil winding free of lubricants that cause stiction problems during the operation of the disk drive assembly. An actuator coil and spindle motor winding are disclosed which include a conductor, an insulating layer over the conductor, a bond coat overlying the insulating layer, and a lubricant coating on the insulating layer. The lubricant coating is a hydrocarbon based oil having a molecular weight within ranges that will not volatilize and condense on the surface of the disks in the drive.

摘要翻译： 本发明提供了一种用于磁盘驱动器部件的线圈组件，其包括一个没有润滑剂的线圈绕组，其在磁盘驱动器组件的操作期间引起静电问题。 公开了一种致动器线圈和主轴电机绕组，其包括导体，导体上的绝缘层，覆盖绝缘层的接合涂层以及绝缘层上的润滑剂涂层。 润滑剂涂料是一种烃基油，其分子量在不会在驱动器中的盘的表面上挥发和冷凝的范围内。

公开(公告)号：US06963212B2

公开(公告)日：2005-11-08

申请号：US10807630

申请日：2004-03-23

申请人： Charles Allen Brown

发明人： Charles Allen Brown

IPC分类号： G01R31/02 ,  G01R31/26 ,  G01R31/317 ,  G01R31/3185

CPC分类号： G01R31/31715 ,  G01R31/318536 ,  G01R31/318577

摘要： The present invention teaches an apparatus for testing the circuitry in an input/output (I/O) pad without probing the contact site on the I/O pad. A dominant driving circuit has an output coupled to a first contact site on a semiconductor chip. A subordinate driving circuit also has an output coupled to the first contact site on the semiconductor chip. A test control circuit sets a drive fight up between the dominant and subordinate driving circuits, the test control circuit selecting a stronger drive strength for the dominant driving circuit than for the subordinate driving circuit. The drive fight produces a test value at the first contact site. The test value from the first contact site is transferred to a second contact site on the semiconductor chip to be probed by an external prober.

摘要翻译： 本发明教导了一种用于测试输入/输出（I / O）焊盘中的电路而不探测I / O焊盘上的接触部位的装置。 显性驱动电路具有耦合到半导体芯片上的第一接触部位的输出。 从属驱动电路还具有耦合到半导体芯片上的第一接触部位的输出。 测试控制电路将主驱动电路和从属驱动电路之间的驱动器设置为对齐，测试控制电路为主驱动电路选择比对于下级驱动电路更强的驱动强度。 驾驶战斗在第一个联系站点产生测试值。 来自第一接触部位的测试值被转移到半导体芯片上的第二接触部位，以由外部探测器探测。

公开(公告)号：US20050212542A1

公开(公告)日：2005-09-29

申请号：US10807630

申请日：2004-03-23

申请人： Charles Allen Brown

发明人： Charles Allen Brown

IPC分类号： G01R31/02 ,  G01R31/26 ,  G01R31/317 ,  G01R31/3185

CPC分类号： G01R31/31715 ,  G01R31/318536 ,  G01R31/318577

摘要： The present invention teaches an apparatus for testing the circuitry in an input/output (I/O) pad without probing the contact site on the I/O pad. A dominant driving circuit has an output coupled to a first contact site on a semiconductor chip. A subordinate driving circuit also has an output coupled to the first contact site on the semiconductor chip. A test control circuit sets a drive fight up between the dominant and subordinate driving circuits, the test control circuit selecting a stronger drive strength for the dominant driving circuit than for the subordinate driving circuit. The drive fight produces a test value at the first contact site. The test value from the first contact site is transferred to a second contact site on the semiconductor chip to be probed by an external prober.

摘要翻译： 本发明教导了一种用于测试输入/输出（I / O）焊盘中的电路而不探测I / O焊盘上的接触部位的装置。 显性驱动电路具有耦合到半导体芯片上的第一接触部位的输出。 从属驱动电路还具有耦合到半导体芯片上的第一接触部位的输出。 测试控制电路将主驱动电路和从属驱动电路之间的驱动器设置为对齐，测试控制电路为主驱动电路选择比对于下级驱动电路更强的驱动强度。 驾驶战斗在第一个联系站点产生测试值。 来自第一接触部位的测试值被转移到半导体芯片上的第二接触部位，以由外部探测器探测。

公开(公告)号：US5789933A

公开(公告)日：1998-08-04

申请号：US741879

申请日：1996-10-30

申请人： Charles Allen Brown ,  Don R. Wiseman

发明人： Charles Allen Brown ,  Don R. Wiseman

IPC分类号： G01R31/26 ,  G01R31/30 ,  G01R31/319 ,  G01R31/3193 ,  H01L21/66 ,  H01L21/8238 ,  H01L27/092

CPC分类号： G01R31/3008 ,  G01R31/3004 ,  G01R31/3193

摘要： IDDQ of an integrated circuit is rapidly measured with system test equipment providing sampled pass/fail outputs. A switch couples the power supply to the integrated circuit and another switch returns a sense signal input to the integrated circuit such that the power may be interrupted to measure the decay of the voltage across the integrated circuit. A monitor signal output is coupled to the integrated circuit to enable monitoring of the voltage decay. At least one processor, which periodically samples the voltage signal, compares the magnitude of the voltage signal at the time of each said periodic sample to a predetermined reference signal, indicates a voltage signal less than the reference signal and calculates the IDDQ based upon the number of periodic samples from the time power is removed from the integrated circuit and the voltage of the reference signal.

摘要翻译： 使用提供采样通过/失败输出的系统测试设备快速测量集成电路的IDDQ。 开关将电源耦合到集成电路，另一个开关将输入的感测信号返回到集成电路，使得功率可能被中断以测量集成电路两端的电压的衰减。 监视器信号输出耦合到集成电路，以便监视电压衰减。 周期性地对电压信号进行采样的至少一个处理器将每个所述周期性采样时的电压信号的幅度与预定参考信号进行比较，指示小于参考信号的电压信号，并基于该数量计算IDDQ 从集成电路中去除时间功率的周期性采样和参考信号的电压。

公开(公告)号：US5757203A

公开(公告)日：1998-05-26

申请号：US732077

申请日：1996-10-16

申请人： Charles Allen Brown

发明人： Charles Allen Brown

IPC分类号： G01R31/30 ,  G01R31/3185 ,  G01R31/28

CPC分类号： G01R31/318577 ,  G01R31/3008 ,  G01R31/3004

摘要： In order to measure IDDQ in a large integrated circuit, multiple IDDQ monitors sampling the current drawn by selected portions of the circuit are placed on the integrated circuit chip. The output of each IDDQ monitor is combined and supplied to one output port when any of the IDDQ monitors detect current in excess of a predetermined threshold. The output of each IDDQ monitor is also stored in a memory for subsequent readout at a second output port for detection of particular portions drawing the excessive current.

摘要翻译： 为了在大型集成电路中测量IDDQ，多个IDDQ监视器采样将电路的选定部分绘制的电流放置在集成电路芯片上。 当任何IDDQ监视器检测到超过预定阈值的电流时，每个IDDQ监视器的输出被组合并提供给一个输出端口。 每个IDDQ监视器的输出也存储在存储器中用于随后在第二输出端口读出以检测绘制过量电流的特定部分。