摘要:
Systems, methods, and media for using relative positioning of items or components in a structure with dynamic ranges, such as an elastic I/O bus design for an Integrated Circuit (IC), are disclosed. Embodiments may include a user-defined type module having user-defined types representing relative instance positions within a structure. Embodiments may also include a translation helper module to receive information associated with a hierarchy and to return location information associated with the hierarchy and a translation module to translate between a specific location and a relative position of the instance based on one or more user-defined types and location information returned from the translation helper module to generate a list of translated results. Further embodiments of the translation module may include a relative position determiner to translate specific locations to relative positions and may also include a specific location determiner to translate relative positions to specific locations.
摘要:
Methods, systems, and media for functional simulation of an I/O bus are disclosed. More particularly, a method of simulating distortion and noise parameters of an I/O bus is disclosed. Embodiments include constraining one or more fields of a record and determining delay amounts based on the resulting parameters, where the final delay amount includes a delay buffer and a net of delay amounts associated with the parameters. Embodiments may also include determining a value of a next bit to be sent to the I/O bus and, after waiting the delay amount, driving the bit on the bus to the next bit value. Parameters may include skew, jitter, duty cycle distortion, voltage reference distortion, and drift of any of these parameters. Further embodiments may include signaling the end of a phase in response to a phase done condition being satisfied.
摘要:
Methods, systems, and media for managing functional verification of a parameterizable design are disclosed. Embodiments include a system having a testbench configuration module adapted to configure a testbench, the testbench having testbench signals and one or more instantiated components having a plurality of ports of a generic design, where the testbench signals are wired to the plurality of ports. The testbench may also have one or more instantiated special components based on chip-specific versions of the design where the special components are wired to the same ports as the generic design. The system may also include a functional verification manager that, through a component module, observes values in the testbench and automatically configure a verification environment based on the observed values, including automatic insertion of checkers at different levels of hierarchy. The testbench may be a VHDL or Verilog testbench in some embodiments.