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    Integrated circuit carrier having built-in circuit verification
    7.
    发明授权
    Integrated circuit carrier having built-in circuit verification 失效
    集成电路载体内置电路验证

    公开(公告)号：US5180976A

    公开(公告)日：1993-01-19

    申请号：US757006

    申请日：1991-09-09

    申请人： David R. Van Loan ,  Charles J. Johnston ,  Mark A. Swart

    发明人： David R. Van Loan ,  Charles J. Johnston ,  Mark A. Swart

    IPC分类号： G01R1/04 ,  G01R31/316

    CPC分类号： G01R1/0425 ,  G01R31/316

    摘要： Integrated circuit (IC) packages mounted on a loaded printed circuit board (PCB) are tested by a translator module by first placing a corresponding module over each package. Each module has rows of spring contacts for releasably contacting corresponding electrical leads adjacent opposite sides of the IC package. An upper surface of the module has an array of electrically conductive test pads internally connected to corresponding contacts on the module. The test pads match an array of spring probes in the test unit. The module can be a molded plastic housing with metal leaf spring contacts, or it can comprise a composite flex-circuit material with individual contacts comprising flexible spring-like metalized plastic fingers. Contacts on the test module can releasably engage the leads on the IC package directly, or they can contact separate conductive leads on the PCB adjacent the leads on the IC package. During testing, the spring probes contact the test pads on the test modules and circuit continuity is established via the electrical connections from the spring probes through the modules to the leads adjacent the IC packages. The modules translate dense in-line spacing of leads adjacent the IC packages to the oversized in-line spacing of test pads on the module. In another embodiment, the translator module is attached to a flex-circuit cable coupled to the test system electronics. The translator module is manually placed over each IC package during testing. In a further embodiment, an integrated circuit package contains a built-in test verifier system so that standard test probes can be used to test the package without use of a separate translator module.

    摘要翻译： 安装在加载印刷电路板（PCB）上的集成电路（IC）封装由转换器模块测试，首先在每个封装上放置相应的模块。 每个模块具有一排弹簧触点，用于可释放地接触与IC封装相对侧相对应的电引线。 模块的上表面具有内部连接到模块上的相应触点的导电测试焊盘阵列。 测试垫与测试单元中的一组弹簧探针相匹配。 模块可以是具有金属板弹簧触点的模制塑料壳体，或者其可以包括具有包括柔性弹簧状金属化塑料指状物的单独触头的复合柔性电路材料。 测试模块上的触点可以直接可释放地接合IC封装上的引线，或者它们可以接触与IC封装上引线相邻的PCB上分开的导电引线。 在测试期间，弹簧探头接触测试模块上的测试焊盘，并通过从弹簧探头通过模块到邻近IC封装的引线的电气连接建立电路连续性。 这些模块将紧邻IC封装的引线的密集在线间距转换为模块上测试焊盘的过大的在线间距。 在另一个实施例中，翻译器模块连接到耦合到测试系统电子装置的柔性电路电缆。 翻译器模块在测试期间手动放置在每个IC封装上。 在另一实施例中，集成电路封装包含内置的测试验证器系统，使得可以使用标准测试探针来测试封装而不使用单独的转换器模块。

    Optical fiber test probe having a sleeve-like plunger movable in a barrel
    8.
    发明授权
    Optical fiber test probe having a sleeve-like plunger movable in a barrel 失效
    光纤测试探针，其具有可在筒中移动的套筒状柱塞

    公开(公告)号：US5134280A

    公开(公告)日：1992-07-28

    申请号：US715025

    申请日：1991-06-13

    申请人： Charles J. Johnston ,  Mark A. Swart

    发明人： Charles J. Johnston ,  Mark A. Swart

    IPC分类号： G02B6/36 ,  G02B6/38 ,  G02B6/42

    CPC分类号： G02B6/3616 ,  G02B6/3873 ,  G02B6/4202 ,  G02B6/3821

    摘要： Optical fiber test probes test the optical functions of light-emitting circuit elements or displays, or are used in optical test fixtures. In one embodiment, an optical fiber test probe comprises an optical fiber in two sections in which both are movable with a receptacle against the bias of a compression spring during testing. One fiber is contained within a removable barrel so it can be replaced by removing it from the receptacle independently of the compression spring. In their operative test position, the two optical fibers are mounted in the receptacle to maintain light-tight optical continuity during testing. In another embodiment, an optical fiber test probe comprises a barrel and an optical fiber contained within a plunger movable in the barrel, in which a free end portion of the optical fiber extends unsupported through a compression spring which applies a spring bias to an internal end of the plunger. The fiber optic probe is isolated from loads imposed on the plunger during repetitive testing with the probe. A further embodiment comprises a fiber optic test having a low compliance, one-piece, spring loaded, molded plastic optical fiber retainer.

    摘要翻译： 光纤测试探头测试发光电路元件或显示器的光学功能，或用于光学测试夹具。 在一个实施例中，光纤测试探头包括在两个部分中的光纤，其中两个部分在测试期间可抵抗压缩弹簧的偏压与插座一起移动。 一个纤维被容纳在可移除的桶内，因此可以独立于压缩弹簧将其从容器中取出来进行更换。 在其操作测试位置，两个光纤安装在插座中，以在测试期间保持不透光的光学连续性。 在另一个实施例中，光纤测试探针包括筒体和容纳在可在筒体内移动的柱塞内的光纤，其中光纤的自由端部分通过压缩弹簧而不支撑，该弹簧将弹簧偏压施加到内部端 的柱塞。 光纤探头与使用探头进行重复测试时与施加在柱塞上的负载隔离。 另一实施例包括具有低顺应性，单件式，弹簧加载的模制塑料光纤保持器的光纤测试。

    Biased BGA contactor probe tip
    9.
    发明授权
    Biased BGA contactor probe tip 失效
    偏置BGA接触器探针尖

    公开(公告)号：US06271672B1

    公开(公告)日：2001-08-07

    申请号：US09140220

    申请日：1998-08-26

    申请人： Mark A. Swart ,  Charles J. Johnston ,  Gordon A. Vinther

    发明人： Mark A. Swart ,  Charles J. Johnston ,  Gordon A. Vinther

    IPC分类号： G01R3106

    CPC分类号： G01R1/06722 ,  G01R1/06738

    摘要： A spring probe for performing tests on an electrical device having a plunger positioned within a barrel and including a spring in the barrel adjacent the plunger to apply a spring force against the plunger. The plunger includes a contact end having an angled surface for contacting the electrical device for applying a side load to the barrel, and a slot in the contact end for dividing the spring force upon contact with the electrical device.

    摘要翻译： 一种弹簧探针，用于在具有定位在镜筒内的柱塞的电气装置上进行测试，并且包括位于所述镜筒内的与所述柱塞相邻的弹簧以对所述柱塞施加弹簧力。 柱塞包括具有成角度的表面的接触端，用于接触电气装置以将侧向负载施加到筒体;以及接触端中的槽，用于在与电气装置接触时分开弹簧力。