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1.发明授权公开(公告)号：US09899046B2
公开(公告)日：2018-02-20
申请号：US13064993
申请日：2011-04-29
申请人： Cheukman Lui , Chiuming Lueng , Hokei Lam , Mankit Lee , Kwokkam Leung , Cheukwing Leung , Juren Ding , Rongkwang Ni
发明人： Cheukman Lui , Chiuming Lueng , Hokei Lam , Mankit Lee , Kwokkam Leung , Cheukwing Leung , Juren Ding , Rongkwang Ni
CPC分类号： G11B5/455 , G01R33/1207 , G11B5/4555 , G11B20/1816 , G11B27/36
摘要： A method of testing anti-high temperature performance of a magnetic head comprises applying a plurality of second magnetic fields with different intensities in a second direction to the magnetic head, and measuring a second output parameter curve, and judging whether a variation that is beyond an allowable value is presented on the second output parameter curve, therein the second direction passes through the ABS and at an angle whose absolute value is an acute angle to the ABS. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head.
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2.发明申请公开(公告)号：US20120275047A1
公开(公告)日：2012-11-01
申请号：US13064993
申请日：2011-04-29
申请人： Cheukman Lui , Chiuming Lueng , Hokei Lam , Mankit Lee , Kwokkam Leung , Cheukwing Leung , Juren Ding , Rongkwang Ni
发明人： Cheukman Lui , Chiuming Lueng , Hokei Lam , Mankit Lee , Kwokkam Leung , Cheukwing Leung , Juren Ding , Rongkwang Ni
IPC分类号： G11B27/36
CPC分类号： G11B5/455 , G01R33/1207 , G11B5/4555 , G11B20/1816 , G11B27/36
摘要： A method of testing anti-high temperature performance of a magnetic head comprises applying a plurality of second magnetic fields with different intensities in a second direction to the magnetic head, and measuring a second output parameter curve, and judging whether a variation that is beyond an allowable value is presented on the second output parameter curve, therein the second direction passes through the ABS and at an angle whose absolute value is an acute angle to the ABS. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head.
摘要翻译： 一种测试磁头的抗高温性能的方法包括：向第二方向施加具有不同强度的多个第二磁场到磁头，以及测量第二输出参数曲线，并且判断是否超出 允许值呈现在第二输出参数曲线上，其中第二方向穿过ABS并以与ABS绝对值成锐角的角度相交。 本发明可以在不加热磁头的情况下屏蔽具有差的抗高温性能的有缺陷的磁头。
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3.发明申请公开(公告)号：US20120274317A1
公开(公告)日：2012-11-01
申请号：US13064994
申请日：2011-04-29
申请人： Chiuming Lueng , Cheukman Lui , Mankit Lee , Hokei Lam , Kwokkam Leung , Cheukwing Leung , Juren Ding , Rongkwang Ni
发明人： Chiuming Lueng , Cheukman Lui , Mankit Lee , Hokei Lam , Kwokkam Leung , Cheukwing Leung , Juren Ding , Rongkwang Ni
IPC分类号： G01R33/12
CPC分类号： G01R33/1207 , B82Y25/00 , G01R33/12 , G11B5/455 , G11B5/4555 , G11B27/36
摘要： A method of testing anti-high temperature performance of a magnetic head comprises applying a second magnetic field with different intensities in a second direction and the changing first magnetic fields in a first direction, and measuring a plurality of second output parameter curves; and judging whether a variation that is beyond an allowable value is presented on the second output parameter curves, thereby screening out a defective magnetic head, therein the first direction is perpendicular to the air bearing surface of the magnetic head, and the second direction is perpendicular to the shielding layers of the magnetic head. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head and with high precision.
摘要翻译： 一种测试磁头的抗高温性能的方法包括：在第二方向施加不同强度的第二磁场，并在第一方向上改变第一磁场，并测量多个第二输出参数曲线; 并且判断在所述第二输出参数曲线上是否存在超出允许值的变化，从而筛选出所述第一方向上的有缺陷的磁头垂直于所述磁头的所述空气支承表面，并且所述第二方向垂直 到磁头的屏蔽层。 本发明可以在不加热磁头的情况下高精度地筛选出具有差的抗高温性能的有缺陷的磁头。
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4.发明授权公开(公告)号：US09121888B2
公开(公告)日：2015-09-01
申请号：US13064994
申请日：2011-04-29
申请人： Chiuming Lueng , Cheukman Lui , Mankit Lee , Hokei Lam , Kwokkam Leung , Cheukwing Leung , Juren Ding , Rongkwang Ni
发明人： Chiuming Lueng , Cheukman Lui , Mankit Lee , Hokei Lam , Kwokkam Leung , Cheukwing Leung , Juren Ding , Rongkwang Ni
CPC分类号： G01R33/1207 , B82Y25/00 , G01R33/12 , G11B5/455 , G11B5/4555 , G11B27/36
摘要： A method of testing anti-high temperature performance of a magnetic head comprises applying a second magnetic field with different intensities in a second direction and the changing first magnetic fields in a first direction, and measuring a plurality of second output parameter curves; and judging whether a variation that is beyond an allowable value is presented on the second output parameter curves, thereby screening out a defective magnetic head, therein the first direction is perpendicular to the air bearing surface of the magnetic head, and the second direction is perpendicular to the shielding layers of the magnetic head. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head and with high precision.
摘要翻译： 一种测试磁头的抗高温性能的方法包括：在第二方向施加不同强度的第二磁场，并在第一方向上改变第一磁场，并测量多个第二输出参数曲线; 并且判断在所述第二输出参数曲线上是否存在超出允许值的变化，从而筛选出所述第一方向上的有缺陷的磁头垂直于所述磁头的所述空气支承表面，并且所述第二方向垂直 到磁头的屏蔽层。 本发明可以在不加热磁头的情况下高精度地筛选出具有差的抗高温性能的有缺陷的磁头。
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