公开(公告)号：US07355431B2

公开(公告)日：2008-04-08

申请号：US11141860

申请日：2005-06-01

申请人： Christopher P Schaffer ,  Johan Strydom ,  Andrea Ciuffoli

发明人： Christopher P Schaffer ,  Johan Strydom ,  Andrea Ciuffoli

IPC分类号： G01R31/26

CPC分类号： G01R1/0735

摘要： A testing apparatus and method for testing a semiconductor device, and more particularly a test arrangement for measuring a guaranteed power loss of a semiconductor module, not requiring the module to have on-board decoupling capacitors for the power loss test. The conventional pogo-pin array and test socket are replaced by a novel low cost anisotropic conductive elastomer and a low cost socket, the conductive polymer providing electrical communication between the socket and the module under test.

摘要翻译： 一种用于测试半导体器件的测试装置和方法，更具体地，用于测量半导体模块的有保证的功率损耗的测试装置，不需要该模块具有用于功率损耗测试的板载去耦电容器。 常规的弹簧针阵列和测试插座由新颖的低成本各向异性导电弹性体和低成本插座代替，导电聚合物在插座和被测模块之间提供电气连接。